The intrinsic domain wall resistance of Fe films with a periodic domain pattern

2009 ◽  
Vol 94 (19) ◽  
pp. 192501 ◽  
Author(s):  
Stijn Vandezande ◽  
Chris Van Haesendonck ◽  
Kristiaan Temst
Keyword(s):  
Domain Wall ◽  
Periodic Domain ◽  
Domain Pattern

scholarly journals Spatially periodic domain wall pinning potentials: Asymmetric pinning and dipolar biasing

2013 ◽  
Vol 113 (7) ◽  
pp. 073906 ◽  
Author(s):  
P. J. Metaxas ◽  
P.-J. Zermatten ◽  
R. L. Novak ◽  
S. Rohart ◽  
J.-P. Jamet ◽  
...  
Keyword(s):  
Domain Wall ◽  
Periodic Domain ◽  
Domain Wall Pinning ◽  
Spatially Periodic

scholarly journals Depinning field of a periodic domain wall array in vicinal nanowires

2009 ◽  
Vol 105 (7) ◽  
pp. 07C116 ◽  
Author(s):  
Ana L. Dantas ◽  
G. O. G. Rebouças ◽  
A. S. Carriço
Keyword(s):  
Domain Wall ◽  
Periodic Domain ◽  
Depinning Field

Dynamics of domain wall motion and domain pattern coarsening in ferroelectric sodium nitrite

1993 ◽  
Vol 140 (1) ◽  
pp. 115-120 ◽  
Author(s):  
Hamano Katsumi ◽  
Zhang Jialiang ◽  
Sakata Hideaki
Keyword(s):  
Domain Wall ◽  
Sodium Nitrite ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
Domain Pattern

Modes of Periodic Domain Wall Motion in Ultrathin Ferromagnetic Layers

2007 ◽  
Vol 99 (9) ◽  
Author(s):  
W. Kleemann ◽  
J. Rhensius ◽  
O. Petracic ◽  
J. Ferré ◽  
J. P. Jamet ◽  
...  
Keyword(s):  
Domain Wall ◽  
Wall Motion ◽  
Domain Wall Motion ◽  
Periodic Domain ◽  
Ferromagnetic Layers

scholarly journals Current-driven periodic domain wall creation in ferromagnetic nanowires

2016 ◽  
Vol 94 (6) ◽  
Author(s):  
Matthias Sitte ◽  
Karin Everschor-Sitte ◽  
Thierry Valet ◽  
Davi R. Rodrigues ◽  
Jairo Sinova ◽  
...  
Keyword(s):  
Domain Wall ◽  
Periodic Domain ◽  
Ferromagnetic Nanowires

Electron Microscopy of Graphite Intercalation Compounds

1982 ◽  
Vol 40 ◽  
pp. 544-545
Author(s):  
G. Timp ◽  
L. Salamanca-Riba ◽  
L.W. Hobbs ◽  
G. Dresselhaus ◽  
M.S. Dresselhaus
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Domain Wall ◽  
Intercalation Compounds ◽  
Lattice Plane ◽  
Wall Model ◽  
Graphite Intercalation Compounds ◽  
Fundamental Symmetry ◽  
Graphite Intercalation

Electron microscopy can be used to study structures and phase transitions occurring in graphite intercalations compounds. The fundamental symmetry in graphite intercalation compounds is the staging periodicity whereby each intercalate layer is separated by n graphite layers, n denoting the stage index. The currently accepted model for intercalation proposed by Herold and Daumas assumes that the sample contains equal amounts of intercalant between any two graphite layers and staged regions are confined to domains. Specifically, in a stage 2 compound, the Herold-Daumas domain wall model predicts a pleated lattice plane structure.

The direct determination of magnetic domain wall profiles using a split detector STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 466-467
Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier
Keyword(s):  
Electron Microscope ◽  
Domain Wall ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Photographic Plate ◽  
Magnetic Domain ◽  
Direct Determination ◽  
Quantitative Information ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

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