A radio frequency device for measurement of minute dielectric property changes in microfluidic channels

2009 ◽  
Vol 94 (2) ◽  
pp. 023901 ◽  
Author(s):  
Chunrong Song ◽  
Pingshan Wang
2012 ◽  
Vol 54 (12) ◽  
pp. 2691-2694 ◽  
Author(s):  
Jin Shao ◽  
Gaurav Manandhar ◽  
Bayaner Arigong ◽  
Hualiang Zhang

RSC Advances ◽  
2015 ◽  
Vol 5 (75) ◽  
pp. 61031-61034 ◽  
Author(s):  
Haoran Sun ◽  
Kama Huang

By applying a low-intensity microwave to DMSO–primary alcohol mixtures, distinct dielectric property changes have been observed.


Sensors ◽  
2020 ◽  
Vol 20 (17) ◽  
pp. 4985
Author(s):  
Ahmed Salim ◽  
Muhammad Usman Memon ◽  
Heijun Jeong ◽  
Sungjoon Lim

Liquid materials’ characterization using commercial probes and radio frequency techniques is expensive and complex. This study proposes a compact and cost-effective radio frequency sensor system to measure the dielectric constant using a three-material calibration. The simplified approach measures reflection coefficient magnitudes for all four materials rather than the complex values in conventional permittivity detection systems. We employ a sensor module based on a circular substrate-integrated waveguide with measured unloaded quality factor = 910 to ensure measurement reliability. Miniaturized quarter-mode substrate-integrated waveguide resonators are integrated with four microfluidic channels containing three known materials and one unknown analyte. Step-wise measurement and linearity ensures maximum 4% error for the dielectric constant compared with results obtained using a high-performance commercial product.


Author(s):  
D.I. Potter ◽  
M. Ahmed ◽  
K. Ruffing

Ion implantation, used extensively for the past decade in fabricating semiconductor devices, now provides a unique means for altering the near-surface chemical compositions and microstructures of metals. These alterations often significantly improve physical properties that depend on the surface of the material; for example, catalysis, corrosion, oxidation, hardness, friction and wear. Frequently the mechanisms causing these beneficial alterations and property changes remain obscure and much of the current research in the area of ion implantation metallurgy is aimed at identifying such mechanisms. Investigators thus confront two immediate questions: To what extent is the chemical composition changed by implantation? What is the resulting microstructure? These two questions can be investigated very fruitfully with analytical electron microscopy (AEM), as described below.


Author(s):  
Brian Ralph ◽  
Barlow Claire ◽  
Nicola Ecob

This brief review seeks to summarize some of the main property changes which may be induced by altering the grain structure of materials. Where appropriate an interpretation is given of these changes in terms of current theories of grain boundary structure, and some examples from current studies are presented at the end of this paper.


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