Dual-band microwave device for sensing dielectric property changes in microfluidic channels

2012 ◽  
Vol 54 (12) ◽  
pp. 2691-2694 ◽  
Author(s):  
Jin Shao ◽  
Gaurav Manandhar ◽  
Bayaner Arigong ◽  
Hualiang Zhang
Keyword(s):  
Dielectric Property ◽  
Microwave Device ◽  
Dual Band ◽  
Microfluidic Channels ◽  
Property Changes

Experimental study of dielectric property changes in DMSO–primary alcohol mixtures under low-intensity microwaves

RSC Advances ◽  
2015 ◽  
Vol 5 (75) ◽  
pp. 61031-61034 ◽  
Author(s):  
Haoran Sun ◽  
Kama Huang
Keyword(s):  
Experimental Study ◽  
Dielectric Property ◽  
Primary Alcohol ◽  
Low Intensity ◽  
Alcohol Mixtures ◽  
Property Changes

By applying a low-intensity microwave to DMSO–primary alcohol mixtures, distinct dielectric property changes have been observed.

DNA sequence mapping in interphase and metaphase chromosomes by fluorescence in situ hybridization

1992 ◽  
Vol 50 (1) ◽  
pp. 496-497
Author(s):  
Barbara Trask ◽  
Susan Allen ◽  
Anne Bergmann ◽  
Mari Christensen ◽  
Anne Fertitta ◽  
...  
Keyword(s):  
In Situ Hybridization ◽  
Dna Sequence ◽  
Dna Sequences ◽  
Dual Band ◽  
Nick Translation ◽  
Metaphase Chromosomes ◽  
Band Pass ◽  
Texas Red ◽  
Fluorescent Spot

Using fluorescence in situ hybridization (FISH), the positions of DNA sequences can be discretely marked with a fluorescent spot. The efficiency of marking DNA sequences of the size cloned in cosmids is 90-95%, and the fluorescent spots produced after FISH are ≈0.3 μm in diameter. Sites of two sequences can be distinguished using two-color FISH. Different reporter molecules, such as biotin or digoxigenin, are incorporated into DNA sequence probes by nick translation. These reporter molecules are labeled after hybridization with different fluorochromes, e.g., FITC and Texas Red. The development of dual band pass filters (Chromatechnology) allows these fluorochromes to be photographed simultaneously without registration shift.

Analytical Electron Microscopy of Ion-Implanted Metals

1985 ◽  
Vol 43 ◽  
pp. 282-285
Author(s):  
D.I. Potter ◽  
M. Ahmed ◽  
K. Ruffing
Keyword(s):  
Electron Microscopy ◽  
Ion Implantation ◽  
Friction And Wear ◽  
Analytical Electron Microscopy ◽  
Chemical Compositions ◽  
Surface Chemical ◽  
Near Surface ◽  
The Past ◽  
Analytical Electron ◽  
Property Changes

Ion implantation, used extensively for the past decade in fabricating semiconductor devices, now provides a unique means for altering the near-surface chemical compositions and microstructures of metals. These alterations often significantly improve physical properties that depend on the surface of the material; for example, catalysis, corrosion, oxidation, hardness, friction and wear. Frequently the mechanisms causing these beneficial alterations and property changes remain obscure and much of the current research in the area of ion implantation metallurgy is aimed at identifying such mechanisms. Investigators thus confront two immediate questions: To what extent is the chemical composition changed by implantation? What is the resulting microstructure? These two questions can be investigated very fruitfully with analytical electron microscopy (AEM), as described below.

Relationships Between Grain Boundary Structure and Material Properties

1980 ◽  
Vol 38 ◽  
pp. 366-369
Author(s):  
Brian Ralph ◽  
Barlow Claire ◽  
Nicola Ecob
Keyword(s):  
Grain Boundary ◽  
Material Properties ◽  
Main Property ◽  
Grain Structure ◽  
Boundary Structure ◽  
Grain Boundary Structure ◽  
Property Changes

This brief review seeks to summarize some of the main property changes which may be induced by altering the grain structure of materials. Where appropriate an interpretation is given of these changes in terms of current theories of grain boundary structure, and some examples from current studies are presented at the end of this paper.

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