Nanoscale surface electrical properties of aluminum zinc oxide thin films investigated by scanning probe microscopy

2008 ◽  
Vol 104 (11) ◽  
pp. 114314 ◽  
Author(s):  
Sy-Hann Chen ◽  
Chang-Feng Yu ◽  
Yung-Shao Lin ◽  
Wen-Jia Xie ◽  
Ting-Wei Hsu ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Oxide Thin Films ◽  
Probe Microscopy ◽  
Aluminum Zinc Oxide

Scanning probe microscopy of nanocrystalline iridium oxide thin films

2003 ◽  
Author(s):  
Daniel Pailharey ◽  
D. Tonneau ◽  
A. Houel ◽  
A. Kuzmin ◽  
R. Kalendarev ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Iridium Oxide ◽  
Scanning Probe ◽  
Oxide Thin Films ◽  
Probe Microscopy

Nanoscale Investigation of Grain Growth in RF-Sputtered Indium Tin Oxide Thin Films by Scanning Probe Microscopy

2014 ◽  
Vol 43 (11) ◽  
pp. 3965-3972 ◽  
Author(s):  
B. S. Lamsal ◽  
M. Dubey ◽  
V. Swaminathan ◽  
Y. Huh ◽  
D. Galipeau ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Growth ◽  
Tin Oxide ◽  
Scanning Probe Microscopy ◽  
Indium Tin Oxide ◽  
Scanning Probe ◽  
Oxide Thin Films ◽  
Probe Microscopy

scholarly journals Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy

2015 ◽  
Vol 132 ◽  
pp. 342-347 ◽  
Author(s):  
C.-S. Jiang ◽  
I.L. Repins ◽  
C. Beall ◽  
H.R. Moutinho ◽  
K. Ramanathan ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Optical and electrical properties of p-type zinc oxide thin films synthesized by ion beam assisted deposition

2005 ◽  
Vol 492 (1-2) ◽  
pp. 203-206 ◽  
Author(s):  
Zhi Yan ◽  
Zhi Tang Song ◽  
Wei Li Liu ◽  
Qing Wan ◽  
Fu Min Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Electrical Properties ◽  
Ion Beam ◽  
Optical And Electrical Properties ◽  
Oxide Thin Films ◽  
Ion Beam Assisted Deposition ◽  
P Type
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