Electron microscopy analysis of crystalline silicon islands formed on screen-printed aluminum-doped p-type silicon surfaces

2008 ◽  
Vol 104 (4) ◽  
pp. 043701 ◽  
Author(s):  
Robert Bock ◽  
Jan Schmidt ◽  
Rolf Brendel ◽  
Henning Schuhmann ◽  
Michael Seibt
Keyword(s):  
Electron Microscopy ◽  
Crystalline Silicon ◽  
Silicon Surfaces ◽  
Type Silicon ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis ◽  
P Type ◽  
Silicon Islands ◽  
Screen Printed

Low-Ohmic Contacting of Laser-Doped p-Type Silicon Surfaces with Pure Ag Screen-Printed and Fired Contacts

2017 ◽  
Vol 214 (12) ◽  
pp. 1700587 ◽  
Author(s):  
Elmar Lohmüller ◽  
Sabrina Werner ◽  
Mohammad Hassan Norouzi ◽  
Simon Gutscher ◽  
Matthias Demant ◽  
...  
Keyword(s):  
Silicon Surfaces ◽  
Type Silicon ◽  
P Type ◽  
Screen Printed

scholarly journals Electron microscopy analysis of biofilms produced by Staphylococcus aureus exposed to UV-light on the surface of SnO2 thin films

2021 ◽  
Vol 27 (S1) ◽  
pp. 3168-3170
Author(s):  
Hazel Jaynelle Morales-Rodriguez ◽  
Javier Camarillo-Cisneros ◽  
María Alejandra Favila-Pérez ◽  
Alva Rocío Castillo-González ◽  
Celia María Quiñonez-Flores ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Staphylococcus Aureus ◽  
Uv Light ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis ◽  
Sno2 Thin Films

scholarly journals Focused Ion Beam (FIB) Preparation and Electron Microscopy Analysis of Individual Microbolometer Pixels

2006 ◽  
Vol 12 (S02) ◽  
pp. 1270-1271
Author(s):  
M Olszta ◽  
J Dougherty ◽  
M Horn ◽  
EC Dickey
Keyword(s):  
Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

scholarly journals Ileal Transposition (IT) Surgery Changing the Ultrastructure of the Transposed Segment as well as Jejunum. Histomorphometric and Electron Microscopy Analysis

2017 ◽  
Vol 28 (5) ◽  
pp. 1232-1239 ◽  
Author(s):  
Tomasz Sawczyn ◽  
Julia Zimmermann ◽  
Dominika Stygar ◽  
Michał Kukla ◽  
Katarzyna Nabrdalik ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Ileal Transposition ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis
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