Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement

2008 ◽  
Vol 79 (9) ◽  
pp. 094706 ◽  
Author(s):  
A. Karbassi ◽  
D. Ruf ◽  
A. D. Bettermann ◽  
C. A. Paulson ◽  
Daniel W. van der Weide ◽  
...  
Keyword(s):  
Thin Film ◽  
Dielectric Constant ◽  
Near Field ◽  
Microwave Microscopy ◽  
Constant Measurement ◽  
Dielectric Constant Measurement ◽  
Film Dielectric

Time-domain dielectric constant measurement of thin film in GHz–THz frequency range near the Brewster angle

1999 ◽  
Vol 74 (15) ◽  
pp. 2113-2115 ◽  
Author(s):  
M. Li ◽  
G. C. Cho ◽  
T.-M. Lu ◽  
X.-C. Zhang ◽  
S.-Q. Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Dielectric Constant ◽  
Time Domain ◽  
Brewster Angle ◽  
Frequency Range ◽  
Constant Measurement ◽  
Dielectric Constant Measurement
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