Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies
2007 ◽
Vol 75
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pp. 239-252
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2008 ◽
Vol 79
(9)
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pp. 094706
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1979 ◽
Vol 28
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pp. 18-25
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Keyword(s):
2016 ◽
Vol 47
(1)
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pp. 1679-1680
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2011 ◽
Vol 130-134
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pp. 2138-2142
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