Thin-Film Studies of High-Tc Compounds

1972 ◽  
Author(s):  
M. Ashkin ◽  
D. W. Deis ◽  
J. R. Gavaler ◽  
C. K. Jones ◽  
Hugh C. Wolfe ◽  
...  
Keyword(s):  
Thin Film ◽  
Film Studies ◽  
High Tc

In-situ laser preparation of high-Tc superconducting thin film at 450°-550° C

1991 ◽  
Author(s):  
Chengwu An ◽  
Yongchang Fan ◽  
Dongsheng Lu ◽  
Zaiguang Li
Keyword(s):  
Thin Film ◽  
Superconducting Thin Film ◽  
High Tc

A UHV chamber for metal-semiconductor and metal-metal thin film studies

1978 ◽  
Vol 149 (1-3) ◽  
pp. 701-704 ◽  
Author(s):  
C.A. Crider ◽  
J.M. Poate ◽  
J.E. Rowe ◽  
G.H. Wheatley
Keyword(s):  
Thin Film ◽  
Film Studies ◽  
Metal Thin Film ◽  
Metal Metal

High-Tc MoN Thin Film Synthesis

1986 ◽  
pp. 603-616 ◽  
Author(s):  
H. Ihara ◽  
K. Senzaki ◽  
Y. Kimura ◽  
M. Hirabayashi ◽  
N. Terada ◽  
...  
Keyword(s):  
Thin Film ◽  
High Tc ◽  
Film Synthesis

Thin-Film Studies of the Reduction of SiO2by Al

1973 ◽  
Vol 56 (4) ◽  
pp. 177-180 ◽  
Author(s):  
K. PRABRIPUTALOONG ◽  
M. R. PIGGOTT
Keyword(s):  
Thin Film ◽  
Film Studies

Thin film processing for high-Tc superconductors

1990 ◽  
Author(s):  
Sergey V. Gaponov ◽  
M. D. Strikovsky ◽  
A. V. Bezvinner ◽  
M. A. Kalyagin ◽  
A. V. Kochemasov
Keyword(s):  
Thin Film ◽  
High Tc Superconductors ◽  
High Tc ◽  
Film Processing ◽  
Thin Film Processing

High-Tc thin film Josephson junctions and DC-SQUIDs

1993 ◽  
Vol 1 (10-12) ◽  
pp. 1665-1673 ◽  
Author(s):  
L. Doerrer ◽  
F. Schmidl ◽  
P. Seidel ◽  
E. Heinz ◽  
K. Zach ◽  
...  
Keyword(s):  
Thin Film ◽  
Josephson Junctions ◽  
High Tc

Grazing-incidence X-ray scattering of lamellar thin films

2019 ◽  
Vol 52 (2) ◽  
pp. 247-251
Author(s):  
Detlef-M. Smilgies
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Small Molecules ◽  
Film Studies ◽  
Grazing Incidence ◽  
Semicrystalline Polymers ◽  
X Ray ◽  
X Ray Scattering ◽  
Incident Plane ◽  
Ray Scattering

Recently, surface and thin-film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X-ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film.

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