In situ estimation of thin film growth rate, complex refractive index, and roughness during chemical vapor deposition using a modified moving horizon estimator

2008 ◽  
Vol 103 (12) ◽  
pp. 124901 ◽  
Author(s):  
Rentian Xiong ◽  
Martha A. Grover
1996 ◽  
Vol 441 ◽  
Author(s):  
F. DiMeo ◽  
R. E. Cavicchi ◽  
S. Sernancik ◽  
J. S. Suchle ◽  
N. H. Tea ◽  
...  

AbstractA method of studying thin film growth and materials processing using micromachined Si-based structures is presented. The microsubstrate platforms (called “microhotplates”) allow temperature control during deposition, andin situmonitoring of the electrical properties of connected coatings. The efficiency of the approach is amplified when multiple. Independentlyoperated elements are used in array configurations. Illustrations here involve chemical vapor deposition of semiconducting oxides, but the methodology can be employed to investigate the growth of other classes of materials as well.


2012 ◽  
Vol 89 ◽  
pp. 109-115 ◽  
Author(s):  
Jong Mun Choi ◽  
Dohan Lee ◽  
Ji Hun Park ◽  
Chang Gyoun Kim ◽  
Taek-Mo Chung ◽  
...  

1990 ◽  
Vol 8 (3) ◽  
pp. 1864-1870 ◽  
Author(s):  
John E. Crowell ◽  
Laura L. Tedder ◽  
Hee‐Chuen Cho ◽  
Frank M. Cascarano ◽  
Mark A. Logan

1993 ◽  
Vol 97 (45) ◽  
pp. 11781-11786 ◽  
Author(s):  
Chao Ming Chiang ◽  
Timothy M. Miller ◽  
Lawrence H. Dubois

2012 ◽  
Vol 83 (9) ◽  
pp. 094701 ◽  
Author(s):  
Eiji Fujimoto ◽  
Masatomo Sumiya ◽  
Tsuyoshi Ohnishi ◽  
Mikk Lippmaa ◽  
Masaki Takeguchi ◽  
...  

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