Precise determination of absolute coverage of thin films by layer-resolved surface states

2008 ◽  
Vol 92 (16) ◽  
pp. 163102 ◽  
Author(s):  
Cheng-Maw Cheng ◽  
Ku-Ding Tsuei ◽  
Chi-Ting Tsai ◽  
Dah-An Luh
Keyword(s):  
Thin Films ◽  
Surface States ◽  
Precise Determination

A dual-styli micro-machined system for precise determination of the thickness of free-standing thin films

2014 ◽  
Author(s):  
Zhi Li ◽  
Sai Gao ◽  
Helmut Wolff ◽  
Uwe Brand ◽  
Ludger Koenders
Keyword(s):  
Thin Films ◽  
Precise Determination ◽  
Free Standing

Study of Structural & Magnetic Properties of CoN Thin Films

2019 ◽  
Author(s):  
Mukul Gupta ◽  
Yogesh Kumar ◽  
Nidhi Pandey ◽  
Akhil Tayal ◽  
Wolfgang Caliebe ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Absorption Spectroscopy ◽  
Precise Determination ◽  
X Ray Diffraction ◽  
Magnetization Measurements ◽  
X Ray ◽  
X Ray Absorption ◽  
Theoretical Simulations

Precise determination of structure of CoN has been achieved combining x-ray diffraction, x-ray absorption spectroscopy measurements and theoretical simulations both at Co and N K-edges and magnetization measurements.<br>

Study of Structural & Magnetic Properties of CoN Thin Films

2019 ◽  
Author(s):  
Mukul Gupta ◽  
Yogesh Kumar ◽  
Nidhi Pandey ◽  
Akhil Tayal ◽  
Wolfgang Caliebe ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Absorption Spectroscopy ◽  
Precise Determination ◽  
X Ray Diffraction ◽  
Magnetization Measurements ◽  
X Ray ◽  
X Ray Absorption ◽  
Theoretical Simulations

Precise determination of structure of CoN has been achieved combining x-ray diffraction, x-ray absorption spectroscopy measurements and theoretical simulations both at Co and N K-edges and magnetization measurements.<br>

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