Evidence for the existence of a metal-insulator-semiconductor junction at the electrode interfaces of CaCu3Ti4O12 thin film capacitors
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2020 ◽
Vol 1481
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pp. 012005
2010 ◽
Vol 157
(7)
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pp. H727
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1992 ◽
Vol 70
(10-11)
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pp. 1171-1177
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1994 ◽
Vol 33
(Part 2, No. 6B)
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pp. L888-L891
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