Coherent terahertz detection with a large-area photoconductive antenna

2007 ◽  
Vol 91 (8) ◽  
pp. 081109 ◽  
Author(s):  
F. Peter ◽  
S. Winnerl ◽  
S. Nitsche ◽  
A. Dreyhaupt ◽  
H. Schneider ◽  
...  
Keyword(s):  
Photoconductive Antenna ◽  
Large Area ◽  
Terahertz Detection

Thin film tandem nanoplasmonic photoconductive antenna for high performance terahertz detection

2018 ◽  
Vol 120 ◽  
pp. 598-604 ◽  
Author(s):  
Saman Ghorbani ◽  
Mohammad Bashirpour ◽  
Jafar Poursafar ◽  
Mohammadreza Kolahdouz ◽  
Mohammad Neshat ◽  
...  
Keyword(s):  
Thin Film ◽  
High Performance ◽  
Photoconductive Antenna ◽  
Terahertz Detection

Terahertz Detection Using Large-Area Plasmonic Nano-Antenna Arrays Based on Stepped Strips

Optik ◽  
2021 ◽  
Vol 228 ◽  
pp. 165886
Author(s):  
Abdulrahman Mesgin Balow ◽  
Mehdi Khatir ◽  
Nasrin Amiri
Keyword(s):  
Antenna Arrays ◽  
Large Area ◽  
Terahertz Detection

scholarly journals Impulsive terahertz radiation with high electric fields from an amplifier-driven large-area photoconductive antenna

2010 ◽  
Vol 18 (9) ◽  
pp. 9251 ◽  
Author(s):  
M. Beck ◽  
H. Schäfer ◽  
G. Klatt ◽  
J. Demsar ◽  
S. Winnerl ◽  
...  
Keyword(s):  
Electric Fields ◽  
Terahertz Radiation ◽  
Photoconductive Antenna ◽  
Large Area ◽  
High Electric Fields

scholarly journals The Fabrication of Large-Area, Uniform Graphene Nanomeshes for High-Speed, Room-Temperature Direct Terahertz Detection

2018 ◽  
Vol 13 (1) ◽  
Author(s):  
Weiqing Yuan ◽  
Min Li ◽  
Zhongquan Wen ◽  
Yanling Sun ◽  
Desheng Ruan ◽  
...  
Keyword(s):  
High Speed ◽  
Room Temperature ◽  
Large Area ◽  
Terahertz Detection

Convergent Beam Electron Diffraction

1978 ◽  
Vol 36 (3) ◽  
pp. 304-315
Author(s):  
G. Lehmpfuhl
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Crystal Surface ◽  
Diffraction Spot ◽  
Crystal Thickness ◽  
Large Area ◽  
Electron Microscopic ◽  
Additional Information ◽  
Microscopic Investigations

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.

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