Leakage currents at crystallites in ZrAlxOy thin films measured by conductive atomic-force microscopy

2007 ◽  
Vol 90 (23) ◽  
pp. 232901 ◽  
Author(s):  
O. Bierwagen ◽  
L. Geelhaar ◽  
X. Gay ◽  
M. Piešiņš ◽  
H. Riechert ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Leakage Currents ◽  
Force Microscopy ◽  
Atomic Force

Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy

2011 ◽  
Vol 5 (10-11) ◽  
pp. 373-375 ◽  
Author(s):  
Martin Ledinský ◽  
Antonín Fejfar ◽  
Aliaksei Vetushka ◽  
Jiří Stuchlík ◽  
Bohuslav Rezek ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Microcrystalline Silicon ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Silicon Thin Films ◽  
Atomic Force
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