Electrical properties of atomically controlled Si:P nanowires created by scanning probe microscopy

2007 ◽  
Author(s):  
F. J. Rueß ◽  
K. E. J. Goh ◽  
Bent Weber ◽  
A. R. Hamilton ◽  
M. Y. Simmons
Keyword(s):  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Fabrication, dynamics, and electrical properties of insulated scanning probe microscopy probes for electrical and electromechanical imaging in liquids

2007 ◽  
Vol 91 (9) ◽  
pp. 093130 ◽  
Author(s):  
B. J. Rodriguez ◽  
S. Jesse ◽  
K. Seal ◽  
A. P. Baddorf ◽  
S. V. Kalinin ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Atomic Structure and Electrical Properties of In(Te) Nanocontacts on CdZnTe(110) by Scanning Probe Microscopy

2010 ◽  
Vol 20 (2) ◽  
pp. 215-223 ◽  
Author(s):  
Gili Cohen-Taguri ◽  
Ori Sinkevich ◽  
Mario Levinshtein ◽  
Arie Ruzin ◽  
Ilan Goldfarb
Keyword(s):  
Electrical Properties ◽  
Atomic Structure ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Comparison of Electrical Properties of Viruses Studied by AC Capacitance Scanning Probe Microscopy

2008 ◽  
Vol 130 (3) ◽  
pp. 887-891 ◽  
Author(s):  
Robert I. MacCuspie ◽  
Nurxat Nuraje ◽  
Sang-Yup Lee ◽  
Anne Runge ◽  
Hiroshi Matsui
Keyword(s):  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate

Micron ◽  
2015 ◽  
Vol 68 ◽  
pp. 17-22 ◽  
Author(s):  
Krzysztof Gajewski ◽  
Daniel Kopiec ◽  
Magdalena Moczała ◽  
Adam Piotrowicz ◽  
Michał Zielony ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Chemical Vapor ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Chemical Vapor Deposited

scholarly journals Morphology and local electrical properties of PTB7:PC71BM blends

2015 ◽  
Vol 3 (16) ◽  
pp. 8706-8714 ◽  
Author(s):  
Alexander Alekseev ◽  
Gordon J. Hedley ◽  
Alaa Al-Afeef ◽  
Oleg A. Ageev ◽  
Ifor D. W. Samuel
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Detailed Structure ◽  
Probe Microscopy ◽  
Transmission Electron

The detailed structure of PTB7:PC71BM blends deposited with and without addition of diiodooctane studied by transmission electron microscopy and scanning probe microscopy.

Nanoscale surface electrical properties of aluminum zinc oxide thin films investigated by scanning probe microscopy

2008 ◽  
Vol 104 (11) ◽  
pp. 114314 ◽  
Author(s):  
Sy-Hann Chen ◽  
Chang-Feng Yu ◽  
Yung-Shao Lin ◽  
Wen-Jia Xie ◽  
Ting-Wei Hsu ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Oxide Thin Films ◽  
Probe Microscopy ◽  
Aluminum Zinc Oxide
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