Ge Migration Effect of Si/Gen/Si(100) Heterostructure Films Probed by Grazing Incidence Fluorescence X-Ray Absorption Fine Structure

2007 ◽  
Author(s):  
Zhiyun Pan ◽  
Hiroyuki Oyanagi ◽  
Zhihu Sun ◽  
Zhi Xie ◽  
Jiangwei Fan ◽  
...  
Keyword(s):  
Fine Structure ◽  
Grazing Incidence ◽  
X Ray ◽  
Absorption Fine ◽  
Migration Effect ◽  
X Ray Absorption

In Situ Grazing-Incidence Extended X-ray Absorption Fine Structure Study of Pb(II) Chemisorption on Hematite (0001) and (1-102) Surfaces

Langmuir ◽  
2004 ◽  
Vol 20 (5) ◽  
pp. 1667-1673 ◽  
Author(s):  
John R. Bargar ◽  
Thomas P. Trainor ◽  
Jeffery P. Fitts ◽  
Scott A. Chambers ◽  
Gordon E. Brown
Keyword(s):  
Fine Structure ◽  
Grazing Incidence ◽  
Structure Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X-ray absorption near edge spectroscopy from reflection x-ray absorption fine structure under the grazing incidence conditions

2004 ◽  
Vol 59 (8) ◽  
pp. 1221-1225 ◽  
Author(s):  
Katsuhiko Tani ◽  
Noriyuki Iwata ◽  
Toshihiko Mitsueda ◽  
Masato Ueha ◽  
Hideo Saisho ◽  
...  
Keyword(s):  
Fine Structure ◽  
Grazing Incidence ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High‐temperature annealings of Sb and Sb/B heavily implanted silicon wafers studied by near grazing incidence fluorescence extended x‐ray absorption fine structure

1996 ◽  
Vol 79 (12) ◽  
pp. 9037-9042 ◽  
Author(s):  
C. Revenant‐Brizard ◽  
J. R. Regnard ◽  
S. Solmi ◽  
A. Armigliato ◽  
S. Valmorri ◽  
...  
Keyword(s):  
Fine Structure ◽  
High Temperature ◽  
Grazing Incidence ◽  
Silicon Wafers ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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