Hard X-ray Linear Dichroism Using a Quarter Wave Plate for Structural Characterization of Diluted Magnetic Semiconductors
2015 ◽
Vol 477
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pp. 20-28
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2014 ◽
Vol 40
(5)
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pp. 6553-6559
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2005 ◽
Vol 280
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pp. 32-43
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Keyword(s):
2018 ◽
Vol 44
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pp. 4126-4131
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1988 ◽
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pp. 1696-1700
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