A Compensating Monochromator Crystal Bender at the HMI Multipole Wiggler Beamline MAGS

2007 ◽  
Author(s):  
E. Dudzik ◽  
R. Feyerherm ◽  
T. Waterstradt ◽  
L.-E. Schröder ◽  
W. Diete ◽  
...  
Keyword(s):  
Monochromator Crystal

Monochromator crystal mounting stage

2002 ◽  
Vol 73 (3) ◽  
pp. 1571-1573 ◽  
Author(s):  
Wilfried Schildkamp
Keyword(s):  
Monochromator Crystal

Neutron transmission through pyrolytic graphite monochromators

2001 ◽  
Vol 34 (3) ◽  
pp. 258-262 ◽  
Author(s):  
D. F. R Mildner ◽  
M. Arif ◽  
S. A. Werner
Keyword(s):  
Thermal Neutron ◽  
Pyrolytic Graphite ◽  
Neutron Transmission ◽  
Horizontal Beam ◽  
Graphite Monochromator ◽  
Monochromator Crystal ◽  
Transmission Data ◽  
Transmission Measurements

Thermal neutron transmission measurements have been made as a function of wavelength on a pyrolytic graphite monochromator crystal that has been set to diffract a horizontal beam at different take-off angles. The major dips in the transmission caused by the various reflections have been identified. These results can be used for the design of a beamline on which more than one instrument is placed. The transmission data show that it is best for the monochromator with the greatest (horizontal) take-off angle to be placed upstream, with monochromators with decreasing take-off angles progressively further downstream. The order of instruments for which the wavelength is greater than 0.43 nm is unimportant.

Self-adapting monochromator crystal for high heat load wiggler beamlines

1996 ◽  
Author(s):  
Horst Schulte-Schrepping ◽  
Zhibi Wang ◽  
Joachim Heuer
Keyword(s):  
Heat Load ◽  
High Heat ◽  
Monochromator Crystal ◽  
High Heat Load

scholarly journals A simultaneous multiple angle-wavelength dispersive X-ray reflectometer using a bent-twisted polychromator crystal

2012 ◽  
Vol 20 (1) ◽  
pp. 80-88 ◽  
Author(s):  
Tadashi Matsushita ◽  
Etsuo Arakawa ◽  
Wolfgang Voegeli ◽  
Yohko F. Yano
Keyword(s):  
Structural Changes ◽  
Vertical Direction ◽  
Sample Surface ◽  
Array Detector ◽  
Single Crystal Substrate ◽  
Time Resolved ◽  
Reflectivity Curve ◽  
X Ray ◽  
Monochromator Crystal ◽  
Crystal Substrate

An X-ray reflectometer has been developed, which can simultaneously measure the whole specular X-ray reflectivity curve with no need for rotation of the sample, detector or monochromator crystal during the measurement. A bent-twisted crystal polychromator is used to realise a convergent X-ray beam which has continuously varying energyE(wavelength λ) and glancing angle α to the sample surface as a function of horizontal direction. This convergent beam is reflected in the vertical direction by the sample placed horizontally at the focus and then diverges horizontally and vertically. The normalized intensity distribution of the reflected beam measured downstream of the specimen with a two-dimensional pixel array detector (PILATUS 100K) represents the reflectivity curve. Specular X-ray reflectivity curves were measured from a commercially available silicon (100) wafer, a thin gold film coated on a silicon single-crystal substrate and the surface of liquid ethylene glycol with data collection times of 0.01 to 1000 s using synchrotron radiation from a bending-magnet source of a 6.5 GeV electron storage ring. A typical value of the simultaneously covered range of the momentum transfer was 0.01–0.45 Å−1for the silicon wafer sample. The potential of this reflectometer for time-resolved X-ray studies of irreversible structural changes is discussed.

IMCA‐CAT BM first monochromator crystal optimization (abstract)

1996 ◽  
Vol 67 (9) ◽  
pp. 3352-3352
Author(s):  
Ivan Neschev Ivanov ◽  
Sorinel Cimpoes ◽  
John Chrzas
Keyword(s):  
Monochromator Crystal

Performance of a bender for a water cooled monochromator crystal at a high power wiggler beamline of the ESRF

1995 ◽  
Vol 66 (2) ◽  
pp. 2092-2094 ◽  
Author(s):  
Hitoshi Yamaoka ◽  
Andreas K. Freund ◽  
Kiyotaka Ohtomo ◽  
Michael Krumrey
Keyword(s):  
High Power ◽  
Monochromator Crystal

scholarly journals All-diamond optical assemblies for a beam-multiplexing X-ray monochromator at the Linac Coherent Light Source

2014 ◽  
Vol 47 (4) ◽  
pp. 1329-1336 ◽  
Author(s):  
S. Stoupin ◽  
S. A. Terentyev ◽  
V. D. Blank ◽  
Yu. V. Shvyd'ko ◽  
K. Goetze ◽  
...  
Keyword(s):  
Light Source ◽  
Coherent Light ◽  
Rigid Substrate ◽  
Simultaneous Operation ◽  
Double Crystal ◽  
X Ray ◽  
Monochromator Crystal ◽  
Linac Coherent Light Source ◽  
Coherent Light Source

A double-crystal diamond (111) monochromator recently implemented at the Linac Coherent Light Source (LCLS) enables splitting of the primary X-ray beam into a pink (transmitted) and a monochromatic (reflected) branch. The first monochromator crystal, with a thickness of ∼100 µm, provides sufficient X-ray transmittance to enable simultaneous operation of two beamlines. This article reports the design, fabrication and X-ray characterization of the first and second (300 µm-thick) crystals utilized in the monochromator and the optical assemblies holding these crystals. Each crystal plate has a region of about 5 × 2 mm with low defect concentration, sufficient for use in X-ray optics at the LCLS. The optical assemblies holding the crystals were designed to provide mounting on a rigid substrate and to minimize mounting-induced crystal strain. The induced strain was evaluated using double-crystal X-ray topography and was found to be small over the 5 × 2 mm working regions of the crystals.

scholarly journals Point-focusing monochromator crystal realized by hot plastic deformation of a Ge wafer

2008 ◽  
Vol 41 (4) ◽  
pp. 798-799 ◽  
Author(s):  
Hiroshi Okuda ◽  
Kazuo Nakajima ◽  
Kozo Fujiwara ◽  
Kohei Morishita ◽  
Shojiro Ochiai
Keyword(s):  
Plastic Deformation ◽  
Single Crystal ◽  
Melting Temperature ◽  
Lattice Plane ◽  
Hot Plastic Deformation ◽  
X Ray ◽  
Monochromator Crystal ◽  
Small Spot ◽  
Inner Surface

Pre-polished Ge(111) single-crystal wafers were deformed just below the melting temperature to prepare point-focusing Johansson monochromator crystals. The (111) lattice plane had curvature 2Rin the focusing plane andRperpendicular to it, with a hemispherical inner surface with a radius ofR= 600 mm. By using CuKα radiation, the diverging X-ray beam was focused onto a small spot.

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