Optimized end station and operating protocols for reflection extended x-ray absorption fine structure (ReflEXAFS) investigations of surface structure at the European Synchrotron Radiation Facility beamline BM29

2007 ◽  
Vol 78 (1) ◽  
pp. 013109 ◽  
Author(s):  
Víctor López-Flores ◽  
Stuart Ansell ◽  
Daniel T. Bowron ◽  
Sofía Díaz-Moreno ◽  
Silvia Ramos ◽  
...  
Keyword(s):  
Fine Structure ◽  
Synchrotron Radiation ◽  
Surface Structure ◽  
European Synchrotron Radiation Facility ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Fluorescence x‐ray absorption fine structure measurements using a synchrotron radiation x‐ray microprobe

1991 ◽  
Vol 62 (11) ◽  
pp. 2545-2549 ◽  
Author(s):  
Shinjiro Hayakawa ◽  
Yohichi Gohshi ◽  
Atsuo Iida ◽  
Sadao Aoki ◽  
Kohei Sato
Keyword(s):  
Fine Structure ◽  
Synchrotron Radiation ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Surface Structure of MgO Thin Films Revealed from X-ray Reflectivity and Near-Edge X-ray Absorption Fine Structure Measurements

2018 ◽  
Vol 10 (9) ◽  
pp. 1372-1376 ◽  
Author(s):  
Jitendra Pal Singh ◽  
Weon Cheol Lim ◽  
Ik-Jae Lee ◽  
Sung OK Won ◽  
Keun Hwa Chae
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Surface Structure ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

scholarly journals Surface Structure of CdSe Nanorods Revealed by Combined X-ray Absorption Fine Structure Measurements and ab Initio Calculations

2007 ◽  
Vol 111 (1) ◽  
pp. 75-79 ◽  
Author(s):  
Deborah M. Aruguete ◽  
Matthew A. Marcus ◽  
Liang-shi Li ◽  
Andrew Williamson ◽  
Sirine Fakra ◽  
...  
Keyword(s):  
Fine Structure ◽  
Ab Initio Calculations ◽  
Ab Initio ◽  
Surface Structure ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Cdse Nanorods

3C-, 4H- and 6H-SiC Bulks Studied by Silicon K-Edge X-Ray Absorption

2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Angular Dependence ◽  
Comparative Studies ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.

scholarly journals Surface Structure and Chemical Switching of Thioctic Acid Adsorbed on Au(111) As Observed Using Near-Edge X-ray Absorption Fine Structure

Langmuir ◽  
2004 ◽  
Vol 20 (12) ◽  
pp. 4939-4944 ◽  
Author(s):  
Trevor M. Willey ◽  
Andrew L. Vance ◽  
Christoph Bostedt ◽  
Tony van Buuren ◽  
Robert W. Meulenberg ◽  
...  
Keyword(s):  
Fine Structure ◽  
Surface Structure ◽  
Thioctic Acid ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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