Extended time bias stress effects in polymer transistors

2006 ◽  
Vol 100 (11) ◽  
pp. 114518 ◽  
Author(s):  
R. A. Street ◽  
M. L. Chabinyc ◽  
F. Endicott ◽  
B. Ong
Keyword(s):  
Extended Time ◽  
Stress Effects ◽  
Bias Stress

Bipolaron mechanism for bias-stress effects in polymer transistors

2003 ◽  
Vol 68 (8) ◽  
Author(s):  
R. A. Street ◽  
A. Salleo ◽  
M. L. Chabinyc
Keyword(s):  
Stress Effects ◽  
Bias Stress

scholarly journals Voltage bias stress effects in metal halide perovskites are strongly dependent on morphology and ion migration pathways

2020 ◽  
Vol 8 (47) ◽  
pp. 25109-25119
Author(s):  
Laura Flannery ◽  
Jonathan Ogle ◽  
Daniel Powell ◽  
Christopher Tassone ◽  
Luisa Whittaker-Brooks
Keyword(s):  
Solar Cell ◽  
Metal Halide ◽  
Research Groups ◽  
Interfacial Interactions ◽  
Ion Migration ◽  
Stress Effects ◽  
Bias Stress ◽  
Voltage Bias ◽  
Halide Perovskites ◽  
Migration Pathways

We determined how morphology, electronic and interfacial interactions affect perovskite PVs under voltage bias stress. Our findings provide insights into the discrepancies in the solar cell efficiencies observed across many different research groups.

Reduction of Positive-Bias-Stress Effects in Bulk-Accumulation Amorphous-InGaZnO TFTs

2014 ◽  
Vol 35 (5) ◽  
pp. 560-562 ◽  
Author(s):  
Seonghyun Jin ◽  
Tae-Woong Kim ◽  
Young-Gug Seol ◽  
Mallory Mativenga ◽  
Jin Jang
Keyword(s):  
Positive Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Amorphous Ingazno

Negative gate bias stress effects on conduction and low frequency noise characteristics in p-type poly-Si thin-film transistors

2019 ◽  
Vol 28 (8) ◽  
pp. 088502
Author(s):  
Chao-Yang Han ◽  
Yuan Liu ◽  
Yu-Rong Liu ◽  
Ya-Yi Chen ◽  
Li Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Gate Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Noise Characteristics ◽  
P Type ◽  
Si Thin Film

Bias-stress effects in organic field-effect transistors based on self-assembled monolayer nanodielectrics

2011 ◽  
Vol 13 (32) ◽  
pp. 14387 ◽  
Author(s):  
Florian Colléaux ◽  
James M. Ball ◽  
Paul H. Wöbkenberg ◽  
Peter J. Hotchkiss ◽  
Seth R. Marder ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Organic Field Effect Transistors ◽  
Self Assembled Monolayer ◽  
Stress Effects ◽  
Bias Stress ◽  
Self Assembled

DC Versus Pulse-Type Negative Bias Stress Effects on the Instability of Amorphous InGaZnO Transistors Under Light Illumination

2011 ◽  
Vol 32 (12) ◽  
pp. 1704-1706 ◽  
Author(s):  
Youn-Gyoung Chang ◽  
Tae-Woong Moon ◽  
Dae-Hwan Kim ◽  
Hee Sung Lee ◽  
Jae Hoon Kim ◽  
...  
Keyword(s):  
Light Illumination ◽  
Negative Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Pulse Type ◽  
Amorphous Ingazno

scholarly journals Oxygen vacancies effects in a-IGZO: Formation mechanisms, hysteresis, and negative bias stress effects (Phys. Status Solidi A 6∕2017)

2017 ◽  
Vol 214 (6) ◽  
pp. 1770131 ◽  
Author(s):  
Albert de Jamblinne de Meux ◽  
Ajay Bhoolokam ◽  
Geoffrey Pourtois ◽  
Jan Genoe ◽  
Paul Heremans
Keyword(s):  
Oxygen Vacancies ◽  
Formation Mechanisms ◽  
Negative Bias ◽  
Stress Effects ◽  
Bias Stress

scholarly journals Oxygen vacancies effects in a-IGZO: Formation mechanisms, hysteresis, and negative bias stress effects

2017 ◽  
Vol 214 (6) ◽  
pp. 1600889 ◽  
Author(s):  
Albert de Jamblinne de Meux ◽  
Ajay Bhoolokam ◽  
Geoffrey Pourtois ◽  
Jan Genoe ◽  
Paul Heremans
Keyword(s):  
Oxygen Vacancies ◽  
Formation Mechanisms ◽  
Negative Bias ◽  
Stress Effects ◽  
Bias Stress

Bias Stress Effects on Different Dielectric Surfaces of Pentacene Thin-Film Transistors

2011 ◽  
Vol 11 (5) ◽  
pp. 4338-4342 ◽  
Author(s):  
Gun Woo Hyung ◽  
Ja-Ryong Koo ◽  
Ji Hoon Seo ◽  
Jin Woo Yang ◽  
Ho Won Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Stress Effects ◽  
Bias Stress ◽  
Dielectric Surfaces
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