DC Versus Pulse-Type Negative Bias Stress Effects on the Instability of Amorphous InGaZnO Transistors Under Light Illumination

2011 ◽  
Vol 32 (12) ◽  
pp. 1704-1706 ◽  
Author(s):  
Youn-Gyoung Chang ◽  
Tae-Woong Moon ◽  
Dae-Hwan Kim ◽  
Hee Sung Lee ◽  
Jae Hoon Kim ◽  
...  
Keyword(s):  
Light Illumination ◽  
Negative Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Pulse Type ◽  
Amorphous Ingazno

Reduction of Positive-Bias-Stress Effects in Bulk-Accumulation Amorphous-InGaZnO TFTs

2014 ◽  
Vol 35 (5) ◽  
pp. 560-562 ◽  
Author(s):  
Seonghyun Jin ◽  
Tae-Woong Kim ◽  
Young-Gug Seol ◽  
Mallory Mativenga ◽  
Jin Jang
Keyword(s):  
Positive Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Amorphous Ingazno

Abnormal Negative Bias Stress Instability of Amorphous InGaZnO Thin Film Transistors

2020 ◽  
Vol MA2020-02 (28) ◽  
pp. 1918-1918
Author(s):  
Chia-Chun Yen ◽  
Chieh Lo ◽  
Yu-Chieh Liu ◽  
Chun-Hung Yeh ◽  
Cheewee Liu
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Bias Stress ◽  
Amorphous Ingazno

scholarly journals Oxygen vacancies effects in a-IGZO: Formation mechanisms, hysteresis, and negative bias stress effects (Phys. Status Solidi A 6∕2017)

2017 ◽  
Vol 214 (6) ◽  
pp. 1770131 ◽  
Author(s):  
Albert de Jamblinne de Meux ◽  
Ajay Bhoolokam ◽  
Geoffrey Pourtois ◽  
Jan Genoe ◽  
Paul Heremans
Keyword(s):  
Oxygen Vacancies ◽  
Formation Mechanisms ◽  
Negative Bias ◽  
Stress Effects ◽  
Bias Stress

scholarly journals Oxygen vacancies effects in a-IGZO: Formation mechanisms, hysteresis, and negative bias stress effects

2017 ◽  
Vol 214 (6) ◽  
pp. 1600889 ◽  
Author(s):  
Albert de Jamblinne de Meux ◽  
Ajay Bhoolokam ◽  
Geoffrey Pourtois ◽  
Jan Genoe ◽  
Paul Heremans
Keyword(s):  
Oxygen Vacancies ◽  
Formation Mechanisms ◽  
Negative Bias ◽  
Stress Effects ◽  
Bias Stress

The Effect of the Active Layer Thickness on the Negative Bias Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors

2011 ◽  
Vol 32 (10) ◽  
pp. 1388-1390 ◽  
Author(s):  
Dongsik Kong ◽  
Hyun-Kwang Jung ◽  
Yongsik Kim ◽  
Minkyung Bae ◽  
Yong Woo Jeon ◽  
...  
Keyword(s):  
Thin Film ◽  
Layer Thickness ◽  
Active Layer ◽  
Thin Film Transistors ◽  
Active Layer Thickness ◽  
Negative Bias ◽  
Bias Stress ◽  
Amorphous Ingazno

Bipolaron mechanism for bias-stress effects in polymer transistors

2003 ◽  
Vol 68 (8) ◽  
Author(s):  
R. A. Street ◽  
A. Salleo ◽  
M. L. Chabinyc
Keyword(s):  
Stress Effects ◽  
Bias Stress
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