Structural and electrical characteristics of Ga2O3(Gd2O3)∕GaAs under high temperature annealing
1999 ◽
Vol 43
(11)
◽
pp. 2075-2079
◽
1981 ◽
Vol 20
(2)
◽
pp. L103-L106
◽
2006 ◽
Vol 9
(11)
◽
pp. F80
◽
Defect reduction in oxygen implanted silicon-on-insulator material during high-temperature annealing
1989 ◽
Vol 47
◽
pp. 604-605