scholarly journals SAXES, a high resolution spectrometer for resonant x-ray emission in the 400–1600eV energy range

2006 ◽  
Vol 77 (11) ◽  
pp. 113108 ◽  
Author(s):  
G. Ghiringhelli ◽  
A. Piazzalunga ◽  
C. Dallera ◽  
G. Trezzi ◽  
L. Braicovich ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Range ◽  
X Ray ◽  
High Resolution Spectrometer ◽  
Resolution Spectrometer

X-ray evolving universe spectroscopy mission (XEUS): narrow-field imaging high-resolution spectrometer: II (1 to 10 keV)

1999 ◽  
Author(s):  
Piet A. J. de Korte ◽  
Henk F. Hoevers ◽  
Marcel P. Bruijn ◽  
Antonio C. Bento ◽  
Willem A. Mels ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray ◽  
Title X ◽  
High Resolution Spectrometer ◽  
Field Imaging ◽  
Resolution Spectrometer

scholarly journals IRIXS Spectrograph: an ultra high-resolution spectrometer for tender RIXS

2021 ◽  
Vol 28 (4) ◽  
Author(s):  
Joel Bertinshaw ◽  
Simon Mayer ◽  
Frank-Uwe Dill ◽  
Hakuto Suzuki ◽  
Olaf Leupold ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Resolution ◽  
X Rays ◽  
Full Width ◽  
X Ray ◽  
X Ray Scattering ◽  
Imaging Approach ◽  
High Resolution Spectrometer ◽  
Resolution Spectrometer ◽  
Better Than

The IRIXS Spectrograph represents a new design of an ultra-high-resolution resonant inelastic X-ray scattering (RIXS) spectrometer that operates at the Ru L 3-edge (2840 eV). First proposed in the field of hard X-rays by Shvyd'ko [(2015), Phys. Rev. A, 91, 053817], the X-ray spectrograph uses a combination of laterally graded multilayer mirrors and collimating/dispersing Ge(111) crystals optics in a novel spectral imaging approach to overcome the energy resolution limitation of a traditional Rowland-type spectrometer [Gretarsson et al. (2020), J. Synchrotron Rad. 27, 538–544]. In combination with a dispersionless nested four-bounce high-resolution monochromator design that utilizes Si(111) and Al2O3(110) crystals, an overall energy resolution better than 35 meV full width at half-maximum has been achieved at the Ru L 3-edge, in excellent agreement with ray-tracing simulations.

X-ray evolving universe spectroscopy mission (XEUS): narrow-field imaging high-resolution spectrometer instrument: I

1999 ◽  
Author(s):  
Peter Verhoeve ◽  
Anthony J. Peacock ◽  
Marcos Bavdaz ◽  
Didier D. E. Martin ◽  
Nicola Rando ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray ◽  
Title X ◽  
High Resolution Spectrometer ◽  
Field Imaging ◽  
Resolution Spectrometer

Nuclear analysis of the DEMO divertor survey visible high-resolution spectrometer

2021 ◽  
Vol 169 ◽  
pp. 112460
Author(s):  
R. Luís ◽  
Y. Nietiadi ◽  
A. Silva ◽  
B. Gonçalves ◽  
T. Franke ◽  
...  
Keyword(s):  
High Resolution ◽  
Nuclear Analysis ◽  
High Resolution Spectrometer ◽  
Resolution Spectrometer

Low pressure spark chambers — high resolution spectrometer for 1 GeV protons

1967 ◽  
Vol 54 (1) ◽  
pp. 71-76 ◽  
Author(s):  
R.J. Sutter ◽  
G. Bennett ◽  
J. Fischer ◽  
J.L. Friedes ◽  
H. Palevsky ◽  
...  
Keyword(s):  
High Resolution ◽  
Low Pressure ◽  
High Resolution Spectrometer ◽  
Resolution Spectrometer

scholarly journals HERMES – An instrument of the future

2009 ◽  
Vol 5 (S262) ◽  
pp. 448-449 ◽  
Author(s):  
Elizabeth Wylie-de Boer ◽  
Kenneth Freeman
Keyword(s):  
Star Formation ◽  
High Resolution ◽  
Resolving Power ◽  
Individual Stars ◽  
Elemental Abundances ◽  
The Future ◽  
The Galaxy ◽  
History Of ◽  
High Resolution Spectrometer ◽  
Resolution Spectrometer

AbstractHERMES is a new, multi-object high resolution spectrometer for the 3.9m Anglo Australian Telescope, using the existing 2dF positioner. The primary goal of the HERMES survey is to unravel the history of the Galaxy from detailed elemental abundances for about 1.2 million individual stars. The HERMES chemical tagging survey concentrates on the 5000 to 8000 Å window at a resolving power of 30,000 in order to identify dissolved star formation aggregates and ascertain the importance of mergers throughout the history of the Galaxy.

Application of a High-Resolution Spectrometer in a Broadband Optical Monitor for Film Coating

2008 ◽  
Vol 53 (9(4)) ◽  
pp. 2307-2311
Author(s):  
Yun-Fei Wu ◽  
Qing-Yuan Cai ◽  
Yu-Xiang Zheng ◽  
Rong-Jun Zhang ◽  
Liang-Yao Chen
Keyword(s):  
High Resolution ◽  
Film Coating ◽  
High Resolution Spectrometer ◽  
Resolution Spectrometer
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