Influence of laser intensity on absorption line broadening in laser absorption spectroscopy

2006 ◽  
Vol 100 (6) ◽  
pp. 063102 ◽  
Author(s):  
Makoto Matsui ◽  
Kimiya Komurasaki ◽  
Satoshi Ogawa ◽  
Yoshihiro Arakawa
2013 ◽  
Vol 2013 ◽  
pp. 1-5
Author(s):  
S. Nomura ◽  
T. Kaneko ◽  
G. Ito ◽  
K. Komurasaki ◽  
Y. Arakawa

Distortion of laser-induced fluorescence profiles attributable to optical absorption and saturation broadening was corrected in combination with laser absorption spectroscopy in argon plasma flow. At high probe-laser intensity, saturated absorption profiles were measured to correct probe-laser absorption. At low laser intensity, nonsaturated absorption profiles were measured to correct fluorescence reabsorption. Saturation broadening at the measurement point was corrected using a ratio of saturated to non-saturated broadening. Observed LIF broadening and corresponding translational temperature without correction were, respectively,2.20±0.05 GHz and2510±100 K and corrected broadening and temperature were, respectively,1.96±0.07 GHz and1990±150 K. Although this correction is applicable only at the center of symmetry, the deduced temperature agreed well with that obtained by LAS with Abel inversion.


1991 ◽  
Vol 250 ◽  
Author(s):  
H. C. Sun ◽  
Y. W. Bae ◽  
E. A. Whittaker ◽  
B. Gallois

AbstractAn understanding of the chemical processes occurring in the gas phase during metalorganic chemical vapor deposition is needed to design novel precursors and for the subsequent control of the composition and the microstructure of the solid product. Tunable diode laser absorption spectroscopy provides a means to precisely monitor specific bond rupture in the precursor during pyrolysis. Methylsilazane [CH3SiHNH]n,, a precursor to silicon-based ceramic thin films, was used to investigate the potential of this technique. Below the decomposition temperature, the intensity of the absorption line at 871.6±0.1 cm−1 corresponding to one of the harmonics from Si-CH3, increased linearly with the vapor pressure of methylsilazane up to 800 Pa and then decreased exponentially. The typical linewidths of the absorption line was approximately 0.006 cm−;1, orders of magnitude narrower than would be observable using conventional infrared techniques. The absorption line was detectable over a pressure range from less than 1 Pa to 10 kPa.


1991 ◽  
Vol 01 (C7) ◽  
pp. C7-471-C7-476
Author(s):  
A. CAMPARGUE ◽  
M. CHENEVIER ◽  
A. DELON ◽  
R. JOST ◽  
F. STOECKEL

2020 ◽  
Vol 56 (12) ◽  
pp. 1284-1289
Author(s):  
Ya. Ya. Ponurovskii ◽  
D. B. Stavrovskii ◽  
Yu. P. Shapovalov ◽  
M. V. Spiridonov ◽  
A. S. Kuz’michev ◽  
...  

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