Degradation mechanism of organic light-emitting device investigated by scanning photoelectron microscopy coupled with peel-off technique

2006 ◽  
Vol 89 (6) ◽  
pp. 063503 ◽  
Author(s):  
H. J. Shin ◽  
M. C. Jung ◽  
J. Chung ◽  
K. Kim ◽  
J. C. Lee ◽  
...  
2000 ◽  
Vol 111-112 ◽  
pp. 229-232 ◽  
Author(s):  
Zoran D Popovic ◽  
Hany Aziz ◽  
Nan-Xing Hu ◽  
Ah-Mee Hor ◽  
Gu Xu

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