Degradation mechanism in simplified phosphorescent organic light-emitting devices utilizing one material for hole transport and emitter host

2013 ◽  
Vol 103 (6) ◽  
pp. 063307 ◽  
Author(s):  
Yingjie Zhang ◽  
Mina M. A. Abdelmalek ◽  
Qi Wang ◽  
Hany Aziz
Keyword(s):  
Degradation Mechanism ◽  
Hole Transport ◽  
Light Emitting ◽  
Light Emitting Devices ◽  
Organic Light ◽  
Organic Light Emitting Devices

Long-Term Degradation Mechanism of Organic Light Emitting Devices Based on Small Molecules

1999 ◽  
Vol 558 ◽  
Author(s):  
Hany Aziz ◽  
Zoran D. Popovic ◽  
Nan-Xing Hu ◽  
Ah-Mee Hor ◽  
Gu Xu
Keyword(s):  
Degradation Mechanism ◽  
Hole Transport ◽  
Transport Layer ◽  
Constant Current ◽  
Hole Transport Layer ◽  
Light Emitting ◽  
Light Emitting Devices ◽  
Organic Light ◽  
Organic Light Emitting Devices

ABSTRACTThe intrinsic degradation of tris(8-hydroxyquinoline) aluminum (AlQ3)-based organic light emitting devices, that leads to the long-term decrease in the electroluminescence efficiency of the devices operated under constant current conditions, is studied. The injection of holes in A1Q3 is found to be the main factor responsible for device degradation. OLEDs with dual HTLs in different arrangements are also presented to demonstrate the proposed degradation mechanism. The role of various approaches to increase OLED lifetime, such as, doping the hole transport layer, introducing a buffer layer at the hole-injecting contact, or using a mixed emitting layer of hole and electron transporting molecules, is explained.

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