scholarly journals Thin-film structures induced by electrostatic field and substrate kinetic constraint

2006 ◽  
Vol 88 (15) ◽  
pp. 153116 ◽  
Author(s):  
Wei Lu ◽  
Dongchoul Kim
Keyword(s):  
Thin Film ◽  
Electrostatic Field ◽  
Kinetic Constraint

Control of the electroresistance effect obtained in Pr0.5Ca0.5MnO3 magnetic oxide thin film by electrostatic field in a ferroelectric/manganite optimized device

2012 ◽  
Author(s):  
Ritha Soulimane ◽  
Anne-Marie Haghiri ◽  
Wilfrid Prellier ◽  
Gilles Poullain ◽  
Rachid Bouregba ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrostatic Field ◽  
Oxide Thin Film ◽  
Magnetic Oxide

Mobility improvement of P3HT thin film by high-voltage electrostatic field-assisted crystallization

2013 ◽  
Vol 9 (4) ◽  
pp. 471-476 ◽  
Author(s):  
Soon-Won Lee ◽  
Chul-Hyun Kim ◽  
Sang-Geul Lee ◽  
Jun-Ho Jeong ◽  
Jun-Hyuk Choi ◽  
...  
Keyword(s):  
Thin Film ◽  
High Voltage ◽  
Electrostatic Field

scholarly journals Thermally Activated Dissipation and Upper Critical Magnetic Field under the Strong Electrostatic Field in the BiPbSrCaCuO Thin Film

1996 ◽  
Vol 06 (C3) ◽  
pp. C3-271-C3-276
Author(s):  
V. S. Lysenko ◽  
Y. V. Gomeniuk ◽  
I. P. Tyagulski ◽  
I. N. Osiyuk ◽  
V. Z. Lozovski ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Film ◽  
Electrostatic Field ◽  
Critical Magnetic Field ◽  
Thermally Activated ◽  
Upper Critical Magnetic Field

A model of coupled thermal, mechanical, and electrostatic field effects in III-N thin film heterostructures

2013 ◽  
Vol 114 (4) ◽  
pp. 044506 ◽  
Author(s):  
Bhamy Maithry Shenoy ◽  
D. Roy Mahapatra ◽  
Gopalkrishna Hegde
Keyword(s):  
Thin Film ◽  
Electrostatic Field ◽  
Field Effects

Clean Electron Microscope Substrate Films Used for Micrometeorite Collection and Study

1967 ◽  
Vol 25 ◽  
pp. 366-367
Author(s):  
D. M. Davies ◽  
R. Kemner ◽  
E. F. Fullam
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
High Altitude ◽  
Amyl Acetate ◽  
Temperature Variations ◽  
Film Forming ◽  
Film Specimen ◽  
Particulate Contaminants

All serious electron microscopists at one time or another have been concerned with the cleanliness and freedom from artifacts of thin film specimen support substrates. This is particularly important where there are relatively few particles of a sample to be found for study, as in the case of micrometeorite collections. For the deposition of such celestial garbage through the use of balloons, rockets, and aircraft, the thin film substrates must have not only all the attributes necessary for use in the electron microscope, but also be able to withstand rather wide temperature variations at high altitude, vibration and shock inherent in the collection vehicle's operation and occasionally an unscheduled violent landing.Nitrocellulose has been selected as a film forming material that meets these requirements yet lends itself to a relatively simple clean-up procedure to remove particulate contaminants. A 1% nitrocellulose solution is prepared by dissolving “Parlodion” in redistilled amyl acetate from which all moisture has been removed.

Microtomy of spherical Al2O3 powders

1983 ◽  
Vol 41 ◽  
pp. 74-75
Author(s):  
E.J. Jenkins ◽  
D.S. Tucker ◽  
J.J. Hren
Keyword(s):  
Thin Film ◽  
Size Range ◽  
Particle Aggregation ◽  
Ion Milling ◽  
Thin Sections ◽  
Α Phase ◽  
Convenient Means ◽  
Van Der Waals Attraction ◽  
Negative Feature ◽  
Film Substrate

The size range of mineral and ceramic particles of one to a few microns is awkward to prepare for examination by TEM. Electrons can be transmitted through smaller particles directly and larger particles can be thinned by crushing and dispersion onto a substrate or by embedding in a film followed by ion milling. Attempts at dispersion onto a thin film substrate often result in particle aggregation by van der Waals attraction. In the present work we studied 1-10 μm diameter Al2O3 spheres which were transformed from the amprphous state to the stable α phase.After the appropriate heat treatment, the spherical powders were embedded in as high a density as practicable in a hard EPON, and then microtomed into thin sections. There are several advantages to this method. Obviously, this is a rapid and convenient means to study the microstructure of serial slices. EDS, ELS, and diffraction studies are also considerably more informative. Furthermore, confidence in sampling reliability is considerably enhanced. The major negative feature is some distortion of the microstructure inherent to the microtoming operation; however, this appears to have been surprisingly small. The details of the method and some typical results follow.

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