Scanning near-field optical microscopy images of microradiographs stored in lithium fluoride films with an optical resolution of λ∕12

2006 ◽  
Vol 88 (14) ◽  
pp. 141107 ◽  
Author(s):  
Alessandro Ustione ◽  
Antonio Cricenti ◽  
Francesca Bonfigli ◽  
Francesco Flora ◽  
Antonella Lai ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Lithium Fluoride ◽  
Near Field ◽  
Optical Resolution ◽  
Microscopy Images

OPTICAL SPECTROSCOPY AND SCANNING NEAR-FIELD OPTICAL MICROSCOPY ON HE+ IRRADIATED LITHIUM FLUORIDE CRYSTALS

EPIOPTICS-7 ◽  
2004 ◽  
Author(s):  
V. MUSSI ◽  
A. CRICENTI ◽  
R.M. MONTEREALI ◽  
B. JACQUIER ◽  
P. MORETTI ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Optical Spectroscopy ◽  
Lithium Fluoride ◽  
Near Field ◽  
Fluoride Crystals

Resolution in near-field optical microscopy

1991 ◽  
Vol 49 ◽  
pp. 454-455
Author(s):  
M. Isaacson
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Resolution ◽  
Super Resolution ◽  
Optical Probe ◽  
Basic Principles ◽  
Scanning Optical Microscopy ◽  
Super Resolution Microscopy ◽  
Near Field Scanning ◽  
Probe Source

It has only been within the last half decade that the concept of super resolution microscopy in the near-field has been vigorously pursued and experimentally demonstrated. However, the idea of optical resolution unhindered by far field diffraction limitations was conceived more than a half century ago by Synge and further elaborated by O'Keefe in the fifties. That die method was possible, however, was only first demonstrated using 3cm wavelength microwaves almost 20 years later.The basic principles of the method of near field scanning optical microscopy (NSOM) have been described before in the literature. Briefly, the idea is as follows: if an optical probe (source or detector) of diameter D is positioned within a distance of approximately D/π from the surface of an object, and the reflected, transmitted or emitted light is detected, then the lateral spatial region from which the information occurs is limited to aregion of approximate size D and not by the wavelength of the illuminated or detected light.

Influence of secondary tip shape on illumination-mode near-field scanning optical microscopy images

1999 ◽  
Vol 16 (8) ◽  
pp. 1936 ◽  
Author(s):  
Lee J. Richter ◽  
Claire E. Jordan ◽  
Richard R. Cavanagh ◽  
Garnett W. Bryant ◽  
Ansheng Liu ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Microscopy Images ◽  
Illumination Mode

scholarly journals SSNOMBACTER: A collection of scattering-type scanning near-field optical microscopy and atomic force microscopy images of bacterial cells

GigaScience ◽  
2020 ◽  
Vol 9 (11) ◽  
Author(s):  
Massimiliano Lucidi ◽  
Denis E Tranca ◽  
Lorenzo Nichele ◽  
Devrim Ünay ◽  
George A Stanciu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Microscopy ◽  
Imaging Techniques ◽  
Near Field ◽  
Bacterial Species ◽  
Life Sciences ◽  
Bacterial Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Images

Abstract Background In recent years, a variety of imaging techniques operating at nanoscale resolution have been reported. These techniques have the potential to enrich our understanding of bacterial species relevant to human health, such as antibiotic-resistant pathogens. However, owing to the novelty of these techniques, their use is still confined to addressing very particular applications, and their availability is limited owing to associated costs and required expertise. Among these, scattering-type scanning near field optical microscopy (s-SNOM) has been demonstrated as a powerful tool for exploring important optical properties at nanoscale resolution, depending only on the size of a sharp tip. Despite its huge potential to resolve aspects that cannot be tackled otherwise, the penetration of s-SNOM into the life sciences is still proceeding at a slow pace for the aforementioned reasons. Results In this work we introduce SSNOMBACTER, a set of s-SNOM images collected on 15 bacterial species. These come accompanied by registered Atomic Force Microscopy images, which are useful for placing nanoscale optical information in a relevant topographic context. Conclusions The proposed dataset aims to augment the popularity of s-SNOM and for accelerating its penetration in life sciences. Furthermore, we consider this dataset to be useful for the development and benchmarking of image analysis tools dedicated to s-SNOM imaging, which are scarce, despite the high need. In this latter context we discuss a series of image processing and analysis applications where SSNOMBACTER could be of help.

The Use of Near-Field Scanning Optical Microscopy for Failure Analysis of ULSI Circuits

1996 ◽  
Author(s):  
R.M. Cramer ◽  
L.J. Balk ◽  
R. Chin ◽  
R. Boylan ◽  
S.B. Kämmer ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Laser Scanning ◽  
Large Scale ◽  
Near Field ◽  
Optical Resolution ◽  
Optical Microscope ◽  
Preparation Technique ◽  
Buried Structures ◽  
Microscopy Techniques ◽  
Near Field Scanning

Abstract As minimum feature sizes decrease for ultra large scale integration, deleterious effects of smallest defects become increasingly important. In order to detect, measure and analyze these defects in buried structures, complementary techniques to those presently used must be developed and explored. Conventional optical microscopy techniques such as UV, confocal and laser scanning are approaching their fundamental limits of resolution. The near-field scanning optical microscope (NSOM) offers sufficiently high spatial resolution (50 nm), and an excellent signal-to-noise ratio to image buried structures inside optically transparent media. In order to investigate defects in layers below the surface of completed devices, we have developed a special sample preparation technique and have demonstrated optical resolution at the 50 nm level. In addition, we have explored the interaction in the image formation of a mixture of near and far field contributions. We show how useful buried layer information may be obtained via NSOM and demonstrate the present limitations of the technique. We compare our results to those obtained by conventional optical microscopy techniques.

Micro-Radiographs Stored in Lithium Fluoride Films Observed by Scanning Near-Field Optical Microscopy

2006 ◽  
Vol 45 (3B) ◽  
pp. 2116-2118 ◽  
Author(s):  
Alessandro Ustione ◽  
Antonio Cricenti ◽  
Francesca Bonfigli ◽  
Francesco Flora ◽  
Antonella Lai ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Lithium Fluoride ◽  
Near Field

What Do we Really See? Resolution in Near-Field Optical Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1183-1184
Author(s):  
M.S. Isaacson
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Resolution ◽  
Super Resolution ◽  
Far Field ◽  
Near Field Optics ◽  
Near Field Imaging ◽  
The Subject ◽  
Super Resolution Microscopy ◽  
Field Imaging

Six years ago there was a symposium held at the 1991 EMS A meeting to discuss the issue of “Resolution in the Microscope”.1 In this paper, we will look at resolution in near-field imaging, a blossoming field, and see whether any of our concepts have changed.It has been only within the last decade that the concept of super-resolution microscopy in the near field has been vigorously pursued and experimentally demonstrated. (For reviews on the subject, the reader is referred to the proceedings of the second and third international conferences on near field optics.) However, as in most areas of microscopy, the idea is not new, but rather rediscovered after decades of dormancy.The idea of optical resolution unhindered by far-field diffraction limitations was conceived more than a half-century ago by E.H. Synge4 in a paper entitled “A Suggested Method for Extending Microscopy Resolution into the Ultra-Microscope Regime”.

Tip-Enhanced Near-Field Optical Microscopy of Quasi-1 D Nanostructures

ChemPhysChem ◽  
2011 ◽  
Vol 13 (4) ◽  
pp. 927-929 ◽  
Author(s):  
Miriam Böhmler ◽  
Achim Hartschuh
Keyword(s):  
Optical Microscopy ◽  
Near Field

scholarly journals Compensating for artifacts in scanning near-field optical microscopy due to electrostatics

APL Photonics ◽  
2021 ◽  
Vol 6 (3) ◽  
pp. 036102
Author(s):  
Tobias Nörenberg ◽  
Lukas Wehmeier ◽  
Denny Lang ◽  
Susanne C. Kehr ◽  
Lukas M. Eng
Keyword(s):  
Optical Microscopy ◽  
Near Field
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