scholarly journals Versatile wide angle diffraction setup for simultaneous wide and small angle x-ray scattering measurements with synchrotron radiation

2006 ◽  
Vol 77 (3) ◽  
pp. 033904 ◽  
Author(s):  
D. R. Rueda ◽  
M. C. García-Gutiérrez ◽  
A. Nogales ◽  
M. J. Capitán ◽  
T. A. Ezquerra ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Small Angle ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Small angle X-ray scattering measurements for supercritical fluid metals using synchrotron radiation

2002 ◽  
Vol 312-314 ◽  
pp. 269-273 ◽  
Author(s):  
Kozaburo Tamura ◽  
Masanori Inui ◽  
Tetsuya Matsusaka ◽  
Daisuke Ishikawa ◽  
Moynul Huq Kazi ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Supercritical Fluid ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

First performance assessment of the small-angle X-ray scattering beamline at ELETTRA

1998 ◽  
Vol 5 (3) ◽  
pp. 506-508 ◽  
Author(s):  
H. Amenitsch ◽  
M. Rappolt ◽  
M. Kriechbaum ◽  
H. Mio ◽  
P. Laggner ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Fibrous Materials ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Double Focusing ◽  
Ray Scattering

The double-focusing high-flux wiggler beamline dedicated to small-angle X-ray scattering (SAXS) and wide-angle X-ray scattering (WAXS) at ELETTRA has gone into user operation recently. It has been designed specifically for time-resolved studies of non-crystalline and fibrous materials in the submillisecond time scale, and has been optimized for small-angle scattering measurements. An overview of the beamline status and of some representative results, highlighting the performance of the SAXS beamline, are given.

scholarly journals Small-angle X-ray scattering measurements of expanded fluid Se in the semiconductor–metal transition region using synchrotron radiation

2007 ◽  
Vol 40 (s1) ◽  
pp. s537-s539 ◽  
Author(s):  
Masanori Inui ◽  
Kazuhiro Matsuda ◽  
Kozaburo Tamura ◽  
Kohei Satoh ◽  
Atsushi Sobajima ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Transition Region ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Time-Resolved Small-Angle X-ray Scattering Combined with Wide-Angle X-ray Scattering

1997 ◽  
Vol 30 (5) ◽  
pp. 816-821 ◽  
Author(s):  
W. Bras ◽  
A. J. Ryan
Keyword(s):  
Synchrotron Radiation ◽  
Small Angle ◽  
Beam Quality ◽  
Third Generation ◽  
Wide Angle ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Radiation Sources ◽  
Ray Scattering

The high X-ray intensity of synchrotron radiation (SR) beamlines makes it possible to perform time-resolved small-angle X-ray scattering (SAXS) experiments. The information that can be obtained by collecting the wide-angle diffraction pattern simultaneously not only increases the information content of an experiment but also increases the reliability of the time-correlations between SAXS and WAXS (wide-angle X-ray scattering) patterns. This is a great advantage for experiments with a time resolution below the level of 1 s per frame. With appropriate instrumentation, this is a time domain that is routinely accessible for a large group of research fields. This has had a considerable impact upon the understanding of fundamental aspects of phase transformations. Not only fundamental processes but also more applied fields have benefited from these developments. In polymer research this has led to a situation in which it has become possible to simulate materials processing techniques on-line. With the advent of third-generation synchrotron-radiation sources (e.g. ESRF, APS, Spring8), it has become possible to develop SAXS/WAXS beamlines that will open up new research opportunities by utilizing the higher intensity, the tuneability and the higher collimation offered by these SR sources. However, some of the instrumentation limits in detector and sample environments that have become apparent in research on second-generation synchrotron-radiation sources still have not been appropriately addressed, which means that in some fields it will not be possible to take full advantage of the superior X-ray beam quality that third-generation synchrotrons can offer. A way in which these instrumentation limits can be overcome is discussed, and the instrumentation for a new bending-magnet beamline at the ESRF is used as an example.

Small angle X-ray scattering measurements of porous low-k films using synchrotron radiation

2006 ◽  
Vol 515 (4) ◽  
pp. 2410-2414 ◽  
Author(s):  
Takashi Suzuki ◽  
Kazuhiko Omote ◽  
Yoshiyasu Ito ◽  
Ichiro Hirosawa ◽  
Yoshihiro Nakata ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Low K ◽  
Ray Scattering

A Revised O2 Reduction Model in Li-O2 Batteries as Revealed by in Situ Small Angle X-Ray Scattering

2019 ◽  
Author(s):  
Christian Prehal ◽  
Aleksej Samojlov ◽  
Manfred Nachtnebel ◽  
Manfred Kriechbaum ◽  
Heinz Amenitsch ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Reduction Mechanism ◽  
Reduction Model ◽  
X Ray ◽  
X Ray Scattering ◽  
O2 Reduction ◽  
Ray Scattering

<b>Here we use in situ small and wide angle X-ray scattering to elucidate unexpected mechanistic insights of the O2 reduction mechanism in Li-O2 batteries.<br></b>

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