Electrical characterization of amorphous lanthanum aluminate thin films grown by molecular-beam deposition on silicon

2006 ◽  
Vol 88 (11) ◽  
pp. 112907 ◽  
Author(s):  
L. F. Edge ◽  
D. G. Schlom ◽  
P. Sivasubramani ◽  
R. M. Wallace ◽  
B. Holländer ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
Electrical Characterization ◽  
Lanthanum Aluminate ◽  
Molecular Beam Deposition ◽  
Beam Deposition

In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

1998 ◽  
Vol 130-132 ◽  
pp. 651-657 ◽  
Author(s):  
Yuji Yoshida ◽  
Hiroshi Takiguchi ◽  
Takeshi Hanada ◽  
Nobutaka Tanigaki ◽  
Eun Mi Han ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
X Ray ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Structural and electrical characterization of pentacene films on SiO2 grown by molecular beam deposition

2004 ◽  
Vol 464-465 ◽  
pp. 398-402 ◽  
Author(s):  
Hirotomo Yanagisawa ◽  
Tsuyoshi Tamaki ◽  
Masakazu Nakamura ◽  
Kazuhiro Kudo
Keyword(s):  
Molecular Beam ◽  
Electrical Characterization ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Growth and Characterization of Copper Indium Diselenide Thin Films by Molecular Beam Deposition

1996 ◽  
Vol 426 ◽  
Author(s):  
H. Y. Ueng ◽  
D. Y. Chang ◽  
J. L. Lin
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
X Ray Diffraction ◽  
Glass Substrates ◽  
Copper Indium ◽  
Molecular Beam Deposition ◽  
Flux Intensity ◽  
Diffraction Patterns ◽  
Beam Deposition

AbstractCuInSe2 thin films grown on Corning 7059 glass substrates were prepared by molecular beam deposition method with various Cu/In ratios in order to study the relationship between composition and material properties. Under a fixed copper beam flux intensity and overpressure selenium environments, the composition of films was modulated by changing the indium beam flux: intensity to obtain Cu-rich or In-rich films. The X-ray diffraction patterns show that the epitaxy films grown onto glass substrates are the polycrystalline structure. The grain size of polycrystalline films indicate that the surface morphology of the films are varied as a function of Cu/In ratio.

Characterization of bis(1,2,5-thiadiazolo)-p-quinobis(1,3-dithiole) thin films grown by organic molecular beam deposition

2001 ◽  
Vol 2 (3-4) ◽  
pp. 143-154 ◽  
Author(s):  
Jiangeng Xue ◽  
Jingui Qin ◽  
Peter V. Bedworth ◽  
Karen Kustedjo ◽  
Seth R. Marder ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Characterization of copper iodide thin films fabricated via laser‐assisted molecular‐beam deposition

1993 ◽  
Vol 74 (9) ◽  
pp. 5767-5772 ◽  
Author(s):  
W. M. K. P. Wijekoon ◽  
M. Y. M. Lyktey ◽  
P. N. Prasad ◽  
J. F. Garvey
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
Copper Iodide ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Structural and Optical Properties of In-Plane Ordered Metallo-Phthalocyanine Thin Films Formed on Sapphire by Organic Molecular Beam Deposition

1995 ◽  
Vol 34 (Part 1, No. 7B) ◽  
pp. 3884-3888 ◽  
Author(s):  
Takayoshi Hayashi ◽  
Tohru Maruno ◽  
Akira Yamashita ◽  
Stefan Fölsch ◽  
Hirohisa Kanbara ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Molecular Beam ◽  
Structural And Optical Properties ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Growth of ordered thin films of tris(phenylquinoxaline) by organic molecular beam deposition

2000 ◽  
Vol 111-112 ◽  
pp. 99-103
Author(s):  
S Blumstengel ◽  
A Sassella ◽  
A Filippini ◽  
M Gurioli ◽  
W Porzio ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
Molecular Beam Deposition ◽  
Beam Deposition

The growth of thin films with high thickness uniformity using ultrahigh vacuum molecular beam deposition

1990 ◽  
Vol 8 (6) ◽  
pp. 3934-3937 ◽  
Author(s):  
C. H. Hale ◽  
I. T. Muirhead ◽  
S. P. Fisher ◽  
J. S. Orr ◽  
J. G. H. Mathew ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
Ultrahigh Vacuum ◽  
Thickness Uniformity ◽  
Molecular Beam Deposition ◽  
Beam Deposition
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