Characterization of Vacancy Defects in Electroplated Cu Films by Positron Annihilation and its Impact on Stress Migration Reliability

2006 ◽  
Author(s):  
T. Suzuki
Keyword(s):  
Positron Annihilation ◽  
Vacancy Defects ◽  
Cu Films

scholarly journals Characterization of vacancy defects in Cu(In,Ga)Se2 by positron annihilation spectroscopy

AIP Advances ◽  
2016 ◽  
Vol 6 (12) ◽  
pp. 125031 ◽  
Author(s):  
M. R. M. Elsharkawy ◽  
G. S. Kanda ◽  
M. V. Yakushev ◽  
E. E. Abdel-Hady ◽  
D. J. Keeble
Keyword(s):  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Vacancy Defects

Characterization of Vacancy Defects in As-Grown and Electron Irradiated GaAs by Positron Annihilation

1986 ◽  
Vol 10-12 ◽  
pp. 265-270 ◽  
Author(s):  
M. Stucky ◽  
C. Corbel ◽  
B. Geffroy ◽  
P. Moser ◽  
Pekka J. Hautojärvi
Keyword(s):  
Positron Annihilation ◽  
Vacancy Defects

scholarly journals Native vacancy defects in Zn1−x(Mn,Co)xGeAs2 studied with positron annihilation spectroscopy

2009 ◽  
Vol 106 (1) ◽  
pp. 013524 ◽  
Author(s):  
L. Kilanski ◽  
A. Zubiaga ◽  
F. Tuomisto ◽  
W. Dobrowolski ◽  
V. Domukhovski ◽  
...  
Keyword(s):  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Vacancy Defects

Characterization of ethylcellulose free films by positron annihilation spectroscopy and mechanical testing

2014 ◽  
Vol 115 ◽  
pp. 47-50 ◽  
Author(s):  
Diána Hegyesi ◽  
Károly Süvegh ◽  
András Kelemen ◽  
Klára Pintye-Hódi ◽  
Géza Regdon
Keyword(s):  
Positron Annihilation ◽  
Mechanical Testing ◽  
Positron Annihilation Spectroscopy ◽  
Free Films

Structural Characterization of Epitaxial GMR Magnetic Multilayers and Spin Valves Grown by Sputter Deposition

2000 ◽  
Vol 614 ◽  
Author(s):  
H. Geng ◽  
R. Loloee ◽  
J.W. Heckman ◽  
J. Bass ◽  
W.P. Pratt ◽  
...  
Keyword(s):  
High Resolution ◽  
Epitaxial Growth ◽  
Magnetic Multilayers ◽  
Sputter Deposition ◽  
Dc Magnetron Sputtering ◽  
Cu Films ◽  
Electron Backscatter ◽  
High Resolution Tem ◽  
Fcc Structure

ABSTRACTEpitaxial Cu/Py/FeMn and (Cu/Co)×20 GMR magnetic multilayers were grown on single crystal (011) Nb that was deposited on (1121) Al2O3 substrates by dc magnetron sputtering. Electron backscatter patterns (EBSPs) revealed that the Cu films display two twin variants, corresponding to two stacking sequences of {111} planes in fcc. The epitaxial orientation relationship between the bcc Nb and both fcc Cu variants was the Nishiyama-Wasserman (N-W) relationship. Conventional TEM observations revealed epitaxial growth for both the Cu/Py/FeMn and (Cu/Co)×20 multilayers. High-resolution TEM confirmed epitaxial growth of close packed (011) Nb on (1120) Al2O3 substrates with [111]Nb∥[0001]Al2O3. Numerous small twins were observed in the Cu near the Cu-Nb interface of the Cu/Py/FeMn multilayer. In the Cu/Co multilayer, the growth planes of the Cu and Co were found to be {100} instead of the expected close-packed {111} planes of the fcc structure.

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