Dielectric properties of ⟨001⟩-oriented Ba0.6Sr0.4TiO3 thin films on polycrystalline metal tapes using biaxially oriented MgO∕γ-Al2O3 buffer layers

2006 ◽  
Vol 88 (6) ◽  
pp. 062907 ◽  
Author(s):  
W. Choi ◽  
B. S. Kang ◽  
Q. X. Jia ◽  
V. Matias ◽  
A. T. Findikoglu
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Buffer Layers ◽  
Polycrystalline Metal

Enhanced Dielectric Properties of Nanocrystalline (Ba0.65Sr0.35)TiO3 Thin Films Grown on CaRuO3 Buffer Layers

2009 ◽  
Vol 9 (10) ◽  
pp. 5834-5838 ◽  
Author(s):  
H. F. Xiong ◽  
X. G. Tang ◽  
L. L. Jiang ◽  
H. L. W. Chan
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Buffer Layers

Effects of LSCO Buffer Layer on the Microstructure and Dielectric Properties of Ba0.6Sr0.4TiO3 Films Prepared by Sol-gel Methods

2009 ◽  
Vol 1199 ◽  
Author(s):  
Songwei Han ◽  
Shengwen Yu ◽  
Jinrong Cheng
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Sol Gel ◽  
Buffer Layers ◽  
X Ray Diffraction ◽  
Random Orientation ◽  
X Ray ◽  
Bst Thin Films ◽  
Structure And Morphology ◽  
Bst Films

AbstractIn this work, Ba0.6Sr0.4TiO3(BST) thin films were deposited on Ti substrates using conductive La0.5Sr0.5CoO3 (LCSO) as buffer layers. Both BST and LSCO films were prepared by sol-gel methods. The structure and morphology of BST and LSCO films were analyzed by X-ray diffraction (XRD). XRD results show that both BST and LSCO films have perovskite structure with random orientation. The dielectric properties of BST films were dependent on the thickness of LSCO buffer layers. Upon using LSCO buffer layers, the dielectric properties of BST films were significantly improved. The dielectric constant, tunability, and dielectric loss of BST thin films for LSCO of 150 nm achieved about 453, 0.032 and 31.26% respectively.

Sputtered YBCO films on metal substrates

1992 ◽  
Vol 7 (7) ◽  
pp. 1636-1640 ◽  
Author(s):  
E. Yin ◽  
M. Rubin ◽  
M. Dixon
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Thermal Expansion ◽  
Epitaxial Films ◽  
Buffer Layers ◽  
Weak Links ◽  
Stabilized Zirconia ◽  
Polycrystalline Metal ◽  
Metal Substrates ◽  
Depth Profiles

Magnetron sputtering was used to deposit superconducting YBCO thin films on four polycrystalline metal substrates. Yttrium-stabilized zirconia (YSZ) and silver were used as buffer layers. The thermal expansion coefficient of the substrate was apparently correlated to the properties of the superconductor. Auger depth profiles showed that the YSZ buffer blocked diffusion of most metal elements from the substrate. Nevertheless, contamination of the films depressed Tc to 81 K on Hastelloy × from 87 K on single-crystal strontium titanate. The films on metal substrates were c-axis oriented, but with random rotation in the a-b plane and smaller grain size than epitaxial films on single crystals. The weak links from these factors restrict Jc to 104 A/cm2 at 40 K.

Dielectric properties of Ba0.6Sr0.4TiO3 thin films using Pb0.3Sr0.7TiO3 buffer layers

2007 ◽  
Vol 91 (25) ◽  
pp. 252908 ◽  
Author(s):  
Sheng-Xiang Wang ◽  
Jian-Hua Hao ◽  
Zhen-Ping Wu ◽  
Dan-Yang Wang ◽  
Yue Zhuo ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Buffer Layers

Structural and dielectric properties of epitaxial Ba0.6Sr0.4TiO3 thin films grown on Si substrates with thin SrO buffer layers

2007 ◽  
Vol 18 (3-4) ◽  
pp. 305-309 ◽  
Author(s):  
Hyun-Suk Kim ◽  
Tae-Seon Hyun ◽  
Ho-Gi Kim ◽  
Tae-Soon Yun ◽  
Jong-Chul Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Buffer Layers ◽  
Si Substrates
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