Study on in-plane optical anisotropy of Si0.75Ge0.25∕Si∕Si0.5Ge0.5 asymmetric superlattice by reflectance difference spectroscopy

2006 ◽  
Vol 88 (7) ◽  
pp. 071908 ◽  
Author(s):  
L. Zhao ◽  
Y. H. Zuo ◽  
W. H. Shi ◽  
Q. M. Wang ◽  
Y. H. Chen ◽  
...  
Keyword(s):  
Optical Anisotropy ◽  
Difference Spectroscopy ◽  
Reflectance Difference Spectroscopy

Optical anisotropy and spontaneous ordering inGa0.5In0.5P: An investigation using reflectance-difference spectroscopy

1995 ◽  
Vol 51 (12) ◽  
pp. 7603-7612 ◽  
Author(s):  
J. S. Luo ◽  
J. M. Olson ◽  
Sarah R. Kurtz ◽  
D. J. Arent ◽  
K. A. Bertness ◽  
...  
Keyword(s):  
Optical Anisotropy ◽  
Difference Spectroscopy ◽  
Reflectance Difference Spectroscopy

Interface-Related In-Plane Optical Anisotropy of Quantum Wells Studied by Reflectance-Difference Spectroscopy

2005 ◽  
Vol 475-479 ◽  
pp. 1777-1782
Author(s):  
Y.H. Chen ◽  
X.L. Ye ◽  
Bo Xu ◽  
Yi Ping Zeng ◽  
Z.G. Wang
Keyword(s):  
Quantum Wells ◽  
Optical Anisotropy ◽  
Interface Roughness ◽  
Difference Spectroscopy ◽  
Quantum Well Structures ◽  
Semiconductor Interfaces ◽  
Atomic Segregation ◽  
Reflectance Difference Spectroscopy ◽  
Transition Index

The in-plane optical anisotropy of three groups of GaAs/AlGaAs quantum well structures has been studied by reflectance-difference spectroscopy (RDS). For GaAs/Al0.36Ga0.64As single QW structures, it is found that the optical anisotropy increases quickly as the well width is decreased. For an Al0.02Ga0.98As/AlAs multiple QW with a well width of 20nm, the optical anisotropy is observed not only for the transitions between ground states but also for those between the excited states with transition index n up to 5. An increase of the anisotropy with the transition energy, or equivalently the transition index n, is clearly observed. The detailed analysis shows that the observed anisotropy arises from the interface asymmetry of QWs, which is introduced by atomic segregation or anisotropic interface roughness formed during the growth of the structures. More, when the 1 ML InAs is inserted at one interface of GaAs/AlGaAs QW, the optical anisotropy of the QW can be increased by a factor of 8 due to the enhanced asymmetry of the QW. These results demonstrate clearly that the RDS is a sensitive and powerful tool for the characterization of semiconductor interfaces.

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