Targeted manipulation of grain boundaries and triple junctions on thin films using lasers: A Potts model simulation

2006 ◽  
Vol 99 (2) ◽  
pp. 023505 ◽  
Author(s):  
Mark T. Lusk ◽  
Moneesh Upmanyu ◽  
Tyrone Vincent
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Potts Model ◽  
Model Simulation ◽  
Triple Junctions

scholarly journals Tem Characterization of Grain Boundaries in Mazed Bicrystal Films of Aluminum

1991 ◽  
Vol 229 ◽  
Author(s):  
U. Dai-Men ◽  
K. H. Westmacott
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Grain Boundaries ◽  
Triple Junctions ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
Tem Characterization ◽  
Crystallographic Symmetry ◽  
Degree Of Anisotropy

AbstractThe structure and faceting behavior of near-90° <110> tilt grain boundaries in thin films of aluminum with a unique mazed bicrystal geometry is characterized by conventional, highresolution and high-voltage electron microscopy. In this microstructure the absence of triple junctions allows grain boundaries to facet in optimum orientation (inclination) during annealing. The degree of anisotropy of the boundaries is expressed in the form of a rose plot. Small local deviations in misorientation are shown to be necessary to accommodate optimum boundary segments. The crystallographic symmetry inherent in this microstructure is apparent and utilizedthroughout the analysis.

Piezoelectric Response and Polarization-Dependent Conductivity of Grain Boundaries in BiFeO3 Thin Films

2019 ◽  
Author(s):  
D.O. Alikin ◽  
Y. Fomichov ◽  
S.P. Reis ◽  
A.S. Abramov ◽  
D.S. Chezganov ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Piezoelectric Response ◽  
Bifeo3 Thin Films

Atomic structure of [0001]-tilt grain boundaries in ZnO:  A high-resolution TEM study of fiber-textured thin films

2004 ◽  
Vol 70 (12) ◽  
Author(s):  
Fumiyasu Oba ◽  
Hiromichi Ohta ◽  
Yukio Sato ◽  
Hideo Hosono ◽  
Takahisa Yamamoto ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Grain Boundaries ◽  
Atomic Structure ◽  
High Resolution Tem

scholarly journals Structural and Electrical Studies on ZnO-Based Thin Films by Laser Irradiation

2016 ◽  
Vol 2016 ◽  
pp. 1-6 ◽  
Author(s):  
Shanyue Zhao ◽  
Yinqun Hua ◽  
Ruifang Chen ◽  
Jian Zhang ◽  
Ping Ji
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Electrical Properties ◽  
Grain Boundaries ◽  
Laser Irradiation ◽  
Nonlinear Coefficient ◽  
Acceptor State ◽  
Xrd Pattern ◽  
Electrical Studies ◽  
Structural And Electrical Properties

The effects of laser irradiation on the structural and electrical properties of ZnO-based thin films were investigated. The XRD pattern shows that the thin films were highly textured along thec-axis and perpendicular to the surface of the substrate. Raman spectra reveal that Bi2O3segregates mainly at ZnO-ZnO grain boundaries. After laser irradiation processing, the grain size of the film was reduced significantly, and the intrinsic atomic defects of grain boundaries and Bi element segregated at the grain boundary were interacted frequently and formed the composite defects of acceptor state. The nonlinear coefficient increased to 24.31 and the breakdown voltage reduced to 5.34 V.

scholarly journals Charge transport mechanism in copper phthalocyanine thin films with and without traps

RSC Advances ◽  
2017 ◽  
Vol 7 (86) ◽  
pp. 54911-54919 ◽  
Author(s):  
Varsha Rani ◽  
Akanksha Sharma ◽  
Pramod Kumar ◽  
Budhi Singh ◽  
Subhasis Ghosh
Keyword(s):  
Thin Films ◽  
Charge Transport ◽  
Grain Boundaries ◽  
Transport Mechanism ◽  
Copper Phthalocyanine ◽  
Organic Thin Films ◽  
Interface States ◽  
Charge Transport Mechanism ◽  
Density Of Interface States

We investigate the charge transport mechanism in copper phthalocyanine thin films with and without traps. We find that the density of interface states at the grain boundaries can decide the mechanism of charge transport in organic thin films.

Migration of grain boundaries and triple junctions in high-purity aluminum during annealing after slight cold rolling

2015 ◽  
Vol 107 ◽  
pp. 134-138 ◽  
Author(s):  
Wenhong Yin ◽  
Weiguo Wang ◽  
Xiaoying Fang ◽  
Congxiang Qin ◽  
Xiaoguang Xing
Keyword(s):  
Cold Rolling ◽  
Grain Boundaries ◽  
High Purity ◽  
Triple Junctions ◽  
High Purity Aluminum

scholarly journals Polymer Charge Transport: Charge-Transport Anisotropy Due to Grain Boundaries in Directionally Crystallized Thin Films of Regioregular Poly(3-hexylthiophene) (Adv. Mater. 16/2009)

2009 ◽  
Vol 21 (16) ◽  
pp. NA-NA
Author(s):  
Leslie H. Jimison ◽  
Michael F. Toney ◽  
Iain McCulloch ◽  
Martin Heeney ◽  
Alberto Salleo
Keyword(s):  
Thin Films ◽  
Charge Transport ◽  
Grain Boundaries ◽  
Regioregular Poly

scholarly journals The effect of 45° grain boundaries and associated Fe particles on Jc and resistivity in Ba(Fe0.9Co0.1)2As2 thin films

2014 ◽  
Author(s):  
J. Hänisch ◽  
K. Iida ◽  
F. Kurth ◽  
T. Thersleff ◽  
S. Trommler ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundaries
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