scholarly journals The effect of 45° grain boundaries and associated Fe particles on Jc and resistivity in Ba(Fe0.9Co0.1)2As2 thin films

Author(s):  
J. Hänisch ◽  
K. Iida ◽  
F. Kurth ◽  
T. Thersleff ◽  
S. Trommler ◽  
...  
Keyword(s):  
2019 ◽  
Author(s):  
D.O. Alikin ◽  
Y. Fomichov ◽  
S.P. Reis ◽  
A.S. Abramov ◽  
D.S. Chezganov ◽  
...  

2004 ◽  
Vol 70 (12) ◽  
Author(s):  
Fumiyasu Oba ◽  
Hiromichi Ohta ◽  
Yukio Sato ◽  
Hideo Hosono ◽  
Takahisa Yamamoto ◽  
...  

2016 ◽  
Vol 2016 ◽  
pp. 1-6 ◽  
Author(s):  
Shanyue Zhao ◽  
Yinqun Hua ◽  
Ruifang Chen ◽  
Jian Zhang ◽  
Ping Ji

The effects of laser irradiation on the structural and electrical properties of ZnO-based thin films were investigated. The XRD pattern shows that the thin films were highly textured along thec-axis and perpendicular to the surface of the substrate. Raman spectra reveal that Bi2O3segregates mainly at ZnO-ZnO grain boundaries. After laser irradiation processing, the grain size of the film was reduced significantly, and the intrinsic atomic defects of grain boundaries and Bi element segregated at the grain boundary were interacted frequently and formed the composite defects of acceptor state. The nonlinear coefficient increased to 24.31 and the breakdown voltage reduced to 5.34 V.


RSC Advances ◽  
2017 ◽  
Vol 7 (86) ◽  
pp. 54911-54919 ◽  
Author(s):  
Varsha Rani ◽  
Akanksha Sharma ◽  
Pramod Kumar ◽  
Budhi Singh ◽  
Subhasis Ghosh

We investigate the charge transport mechanism in copper phthalocyanine thin films with and without traps. We find that the density of interface states at the grain boundaries can decide the mechanism of charge transport in organic thin films.


2009 ◽  
Vol 21 (16) ◽  
pp. NA-NA
Author(s):  
Leslie H. Jimison ◽  
Michael F. Toney ◽  
Iain McCulloch ◽  
Martin Heeney ◽  
Alberto Salleo

Author(s):  
Pornvitoo Rittinon ◽  
Ken Suzuki ◽  
Hideo Miura

Copper thin films are indispensable for the interconnections in the advanced electronic products, such as TSV (Trough Silicon Via), fine bumps, and thin-film interconnections in various devices and interposers. However, it has been reported that both electrical and mechanical properties of the films vary drastically comparing with those of conventional bulk copper. The main reason for the variation can be attributed to the fluctuation of the crystallinity of grain boundaries in the films. Porous or sparse grain boundaries show very high resistivity and brittle fracture characteristic in the films. Thus, the thermal conductivity of the electroplated copper thin films should be varied drastically depending on their micro texture based on the Wiedemann-Franz’s law. Since the copper interconnections are used not only for the electrical conduction but also for the thermal conduction, it is very important to quantitatively evaluate the crystallinity of the polycrystalline thin-film materials and clarify the relationship between the crystallinity and thermal properties of the films. The crystallinity of the interconnections were quantitatively evaluated using an electron back-scatter diffraction method. It was found that the porous grain boundaries which contain a significant amount of vacancies increase the local electrical resistance in the interconnections, and thus, cause the local high Joule heating. Such porous grain boundaries can be eliminated by control the crystallinity of the seed layer material on which the electroplated copper thin film is electroplated.


2015 ◽  
Vol 96 ◽  
pp. 284-291 ◽  
Author(s):  
Thomas LaGrange ◽  
Kazuto Arakawa ◽  
Hidehiro Yasuda ◽  
Mukul Kumar

1998 ◽  
Vol 53 (1-2) ◽  
pp. 125-131 ◽  
Author(s):  
D.J. Miller ◽  
V.R. Todt ◽  
M.St. Louis-Weber ◽  
X.F. Zhang ◽  
D.G. Steel ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (65) ◽  
pp. 60074-60079 ◽  
Author(s):  
Ying Ding ◽  
Xing Xu ◽  
Amar Bhalla ◽  
Xiubo Yang ◽  
Jianghua Chen ◽  
...  

Oxygen deficient BaZrO3 films with bi-layered structures show switchable diode effects. Both oxygen vacancies and grain boundaries play important parts.


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