scholarly journals A force sensor for atomic point contacts

2005 ◽  
Vol 76 (10) ◽  
pp. 103903 ◽  
Author(s):  
A. M. C. Valkering ◽  
A. I. Mares ◽  
C. Untiedt ◽  
K. Babaei Gavan ◽  
T. H. Oosterkamp ◽  
...  
Keyword(s):  
Force Sensor ◽  
Point Contacts ◽  
Atomic Point Contacts

scholarly journals Quantum Degeneracy in Atomic Point Contacts Revealed by Chemical Force and Conductance

2013 ◽  
Vol 111 (10) ◽  
Author(s):  
Yoshiaki Sugimoto ◽  
Martin Ondráček ◽  
Masayuki Abe ◽  
Pablo Pou ◽  
Seizo Morita ◽  
...  
Keyword(s):  
Point Contacts ◽  
Quantum Degeneracy ◽  
Atomic Point Contacts ◽  
Chemical Force

Supercurrent in Atomic Point Contacts and Andreev States

2000 ◽  
Vol 85 (1) ◽  
pp. 170-173 ◽  
Author(s):  
M. F. Goffman ◽  
R. Cron ◽  
A. Levy Yeyati ◽  
P. Joyez ◽  
M. H. Devoret ◽  
...  
Keyword(s):  
Point Contacts ◽  
Atomic Point Contacts

scholarly journals Electromigration-induced directional steps towards formation of single atomic Ag contacts.

2019 ◽  
Author(s):  
Atasi Chatterjee ◽  
Christoph Tegenkamp ◽  
Herbert Pfnür
Keyword(s):  
Fourier Transforms ◽  
Point Contact ◽  
Point Contacts ◽  
Cross Sectional ◽  
Shell Effects ◽  
Average Grain Size ◽  
Directional Motion ◽  
Morphological Differences ◽  
Atomic Point Contacts ◽  
Thinning Process

Background:The process of electromigration is still not quantitatively understood. We showed recently that it can be used reliably for formation of single atomic point contacts in pre-structured Ag nanostructures. Results:The process of formation of nanocontacts by electromigration (EM) down to a single atomic point contact was investigated for ultrathin (5 nm) Ag structures at 100\,K. In this paper, we compare the structures with constrictions below the average grain size of Ag layers (15 nm), where the contribution of a single grain dominates, with structures of much larger constrictions of around 150 nm with multiple grains at the centre constriction during the initial steps of EM. The latter initially form filamentous structures. Despite these clear morphological differences, the conductance traces of both types of structures suggest that finally, i.e., in the quantized conduction regime, only one atomic point contact was formed. To analyse the thinning process within the semi-classical regime in detail, we used experimental conductance histograms in the range between 2 G0 and 15G0 and their corresponding Fourier transforms (FT). The FT analysis of the conductance histograms exhibits a clear preference for thinning along the [100] direction. Using well-established models, both atom-by-atom steps and ranges of stability, presumably caused by electronic shell effects, can be discriminated. A large range (5 to 14G0) of unstable conductance values was found in these electromigrated contacts that has not been reported by other techniques. It was observed irrespective of the initial geometry. Conclusion: Although the directional motion of atoms during EM leads to specific properties like the instabilities mentioned, similarities to mechanically opened contacts with respect to cross sectional stability were found.

The quantum spin-valve in cobalt atomic point contacts

2005 ◽  
Vol 4 (11) ◽  
pp. 832-837 ◽  
Author(s):  
Harsh Deep Chopra ◽  
Matthew R. Sullivan ◽  
Jason N. Armstrong ◽  
Susan Z. Hua
Keyword(s):  
Spin Valve ◽  
Quantum Spin ◽  
Point Contacts ◽  
Atomic Point Contacts

Structure-related effects on the domain wall migration in atomic point contacts

2007 ◽  
Vol 316 (2) ◽  
pp. e934-e936
Author(s):  
Maria Stamenova ◽  
Sudhakar Sahoo ◽  
Tchavdar N. Todorov ◽  
Stefano Sanvito
Keyword(s):  
Domain Wall ◽  
Point Contacts ◽  
Atomic Point Contacts

scholarly journals Infrared light emission from nano hot electron gas created in atomic point contacts

2016 ◽  
Vol 114 (5) ◽  
pp. 57002 ◽  
Author(s):  
T. Malinowski ◽  
H. R. Klein ◽  
M. Iazykov ◽  
Ph. Dumas
Keyword(s):  
Light Emission ◽  
Electron Gas ◽  
Infrared Light ◽  
Hot Electron ◽  
Point Contacts ◽  
Atomic Point Contacts
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