Techniques for Improving SIMS Depth Resolution: C[sub 60]+] Primary Ions and Backside Depth Profile Analysis
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2014 ◽
Vol 29
(11)
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pp. 2072-2077
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1990 ◽
Vol 51
(1)
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pp. 34-40
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1992 ◽
Vol 18
(1)
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pp. 52-58
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2008 ◽
Vol 72
(7)
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pp. 895-898
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1990 ◽
Vol 15
(8)
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pp. 463-465
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1990 ◽
Vol 52
(1)
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pp. 79-82
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2004 ◽
Vol 17
(4)
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pp. 535-540
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