Analysis of Error Sources in On-Wafer Noise Characterization of RF CMOS Transistors
1997 ◽
Vol 37
(10-11)
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pp. 1599-1602
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1997 ◽
Vol 216
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pp. 192-197
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1998 ◽
Vol 167
(1)
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pp. 261-270
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2020 ◽
Vol 1674
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pp. 012004
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2015 ◽
Vol 14
(5-6)
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pp. 729-766
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2013 ◽
Vol 46
(10)
◽
pp. 3887-3897
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