Low-Frequency Noise Characterization of 90 nm Multiple Gate Oxide CMOS Transistors
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1997 ◽
Vol 37
(10-11)
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pp. 1599-1602
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1997 ◽
Vol 216
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pp. 192-197
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1998 ◽
Vol 167
(1)
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pp. 261-270
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2003 ◽
Vol 50
(4)
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pp. 921-927
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