Significant stiffness reduction at ferroelectric domain boundary evaluated by ultrasonic atomic force microscopy

2005 ◽  
Vol 87 (7) ◽  
pp. 071909 ◽  
Author(s):  
T. Tsuji ◽  
S. Saito ◽  
K. Fukuda ◽  
K. Yamanaka ◽  
H. Ogiso ◽  
...  
2004 ◽  
Vol 43 (5B) ◽  
pp. 2907-2913 ◽  
Author(s):  
Toshihiro Tsuji ◽  
Hisato Ogiso ◽  
Jun Akedo ◽  
Shigeru Saito ◽  
Kenji Fukuda ◽  
...  

2010 ◽  
Vol 108 (6) ◽  
pp. 064102 ◽  
Author(s):  
Manas Kumar Roy ◽  
Jaita Paul ◽  
Sushanta Dattagupta

2004 ◽  
Vol 84 (13) ◽  
pp. 2382-2384 ◽  
Author(s):  
Seungbum Hong ◽  
Bastien Ecabart ◽  
Enrico L. Colla ◽  
Nava Setter

2003 ◽  
Vol 798 ◽  
Author(s):  
J. Jasinski ◽  
T. Tomaszewicz ◽  
Z. Liliental-Weber ◽  
Q. S. Paduano ◽  
D. W. Weyburne

ABSTRACTV-like columnar inversion domains with a divergence angle of about 4.5° ± 1° grown in AlN films with N-polarity were studied using transmission electron microscopy (TEM) and atomic force microscopy. Such domains emerge at the surface forming a small islands in form of hexagonal, truncated pyramids. A model of such pyramid was proposed. TEM studies indicate a displacement of c/2 along the [0001] direction at the inversion domain boundary. A boundary itself is composed of long segments located on the {1100} planes, which are alternated by short segments on some inclined planes.


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