Element-selective vertical height determination for an organic monolayer by a scanned-energy photoelectron-yield soft x-ray standing wave technique

2005 ◽  
Vol 87 (3) ◽  
pp. 031911 ◽  
Author(s):  
H. Kondoh ◽  
R. Yokota ◽  
K. Amemiya ◽  
T. Shimada ◽  
I. Nakai ◽  
...  
Keyword(s):  
Standing Wave ◽  
X Ray ◽  
Organic Monolayer ◽  
Height Determination ◽  
Wave Technique ◽  
Vertical Height

A simple X-ray standing wave technique for surface structure determination - theory and an application

1988 ◽  
Vol 195 (1-2) ◽  
pp. 237-254 ◽  
Author(s):  
D.P. Woodruff ◽  
D.L. Seymour ◽  
C.F. McConville ◽  
C.E. Riley ◽  
M.D. Crapper ◽  
...  
Keyword(s):  
Surface Structure ◽  
Standing Wave ◽  
Structure Determination ◽  
X Ray ◽  
Wave Technique

Growth of GaSe ultrathin films on Si(111) substrates analyzed by the x-ray standing-wave technique

1997 ◽  
Vol 56 (19) ◽  
pp. 12296-12302 ◽  
Author(s):  
A. Koëbel ◽  
Y. Zheng ◽  
J. F. Pétroff ◽  
J. C. Boulliard ◽  
B. Capelle ◽  
...  
Keyword(s):  
Standing Wave ◽  
Ultrathin Films ◽  
X Ray ◽  
Wave Technique

Arrangement of trace metal contaminations in thin films of liquid crystals studied by X-ray standing wave technique

2006 ◽  
Vol 61 (10-11) ◽  
pp. 1229-1235 ◽  
Author(s):  
N.N. Novikova ◽  
S.I. Zheludeva ◽  
N.D. Stepina ◽  
A.L. Tolstikhina ◽  
R.V. Gaynutdinov ◽  
...  
Keyword(s):  
Thin Films ◽  
Liquid Crystals ◽  
Trace Metal ◽  
Standing Wave ◽  
X Ray ◽  
Wave Technique

scholarly journals Fe diffusion in amorphous Si studied using x-ray standing wave technique

AIP Advances ◽  
2012 ◽  
Vol 2 (1) ◽  
pp. 012159 ◽  
Author(s):  
Parasmani Rajput ◽  
Ajay Gupta ◽  
S. Rajagopalan ◽  
A. K. Tyagi
Keyword(s):  
Standing Wave ◽  
X Ray ◽  
Wave Technique ◽  
Amorphous Si
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