Combined Raman scattering, X-ray fluorescence and ellipsometry in-situ growth monitoring of CuInSe2-based photoabsorber layers on polyimide substrates

Author(s):  
C. Bundesmann
2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.


Solar Energy ◽  
2018 ◽  
Vol 170 ◽  
pp. 102-112 ◽  
Author(s):  
D. Abou-Ras ◽  
M. Bär ◽  
R. Caballero ◽  
R. Gunder ◽  
C. Hages ◽  
...  

2020 ◽  
Vol 22 (33) ◽  
pp. 18435-18446
Author(s):  
Luke J. R. Higgins ◽  
Christoph J. Sahle ◽  
Mahalingam Balasubramanian ◽  
Bhoopesh Mishra

X-ray Raman scattering (XRS) spectroscopy provides access to element-specific core photo-absorption edges of low Z-elements (e.g. K-edges of C, N, O), using hard X-ray photons enabling bulk and in situ study of green carbons.


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