A Raman-scattering study on the interface structure of nanolayered TiAlN∕TiN and TiN∕NbN multilayer thin films grown by reactive dc magnetron sputtering
2020 ◽
Vol 163
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pp. 110293
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2017 ◽
Vol 4
(5)
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pp. 6311-6316
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Keyword(s):
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2008 ◽
Vol 15
(4)
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pp. 449-453
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Keyword(s):
2009 ◽
Vol 282
(2)
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pp. 247-252
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