Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films

2005 ◽  
Vol 86 (11) ◽  
pp. 113108 ◽  
Author(s):  
Sandrine Dourdain ◽  
Jean-François Bardeau ◽  
Maggy Colas ◽  
Bernd Smarsly ◽  
Ahmad Mehdi ◽  
...  
Keyword(s):  
Thin Films ◽  
Mesoporous Silica ◽  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Silica Thin Films ◽  
Porous Properties ◽  
Ray Scattering

Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering

2009 ◽  
Vol 113 (38) ◽  
pp. 12623-12627 ◽  
Author(s):  
Hong-Ji Chen ◽  
Sheng-Ying Li ◽  
Xiao-Jun Liu ◽  
Rui-Peng Li ◽  
Detlef-M. Smilgies ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Pore Structures ◽  
Organosilicate Thin Films ◽  
Ray Scattering

scholarly journals Evaluation of the Dispersion Stability of AZO Mesocrystals for Their Processing into Functional Thin Films Using Small Angle X-ray Scattering

Crystals ◽  
2020 ◽  
Vol 10 (5) ◽  
pp. 374
Author(s):  
Julian Ungerer ◽  
Ann-Kathrin Thurm ◽  
Georg Garnweitner ◽  
Hermann Nirschl
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Dispersion Stability ◽  
Synthesis Process ◽  
Stable Phase ◽  
Process Chain ◽  
X Ray ◽  
Entire Process ◽  
X Ray Scattering ◽  
Ray Scattering

Within the scope of the comprehensive elucidation of the entire process chain for the production of highly functional thin films made of semiconducting aluminum-doped zinc oxide ( A Z O ) nanocrystals, this work deals with the detailed investigation of the stabilization sub-process, considering the requirements for the subsequent coating process. An innovative investigation procedure using non-invasive small angle X-ray scattering ( S A X S ) is developed, enabling an evaluation of qualitative and quantitative dispersion stability criteria of sterically stabilized A Z O nanocrystals. On the one hand, qualitative criteria for minimizing layer inhomogeneities due to sedimentation as well as aggregate formation are discussed, enabling a high particle occupancy density. On the other hand, a procedure for determining the A Z O concentration using S A X S , both in the stable phase and in the non-stabilized phase, is demonstrated to provide a quantitative evaluation of the stabilization success, having a significant impact on the final layer thickness. The obtained insights offer a versatile tool for the precise stabilization process control based on synthesis process using S A X S to meet coating specific requirements and thus a successful integration into the entire process chain for the production of functional A Z O thin films.

In-Situ Grazing Incidence Small-Angle X-ray Scattering Studies on Nanopore Evolution in Low-kOrganosilicate Dielectric Thin Films

2005 ◽  
Vol 38 (8) ◽  
pp. 3395-3405 ◽  
Author(s):  
Byeongdu Lee ◽  
Jinhwan Yoon ◽  
Weontae Oh ◽  
Yongtaek Hwang ◽  
Kyuyoung Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Structure of Glancing Incidence Deposited TiO2 Thin Films as Revealed by Grazing Incidence Small-Angle X-ray Scattering

ChemPhysChem ◽  
2010 ◽  
Vol 11 (10) ◽  
pp. 2205-2208 ◽  
Author(s):  
Lola González-García ◽  
Angel Barranco ◽  
Adela Muñoz Páez ◽  
Agustín R. González-Elipe ◽  
Mari-Cruz García-Gutiérrez ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Tio2 Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Nano-structure in micro-crystalline silicon thin films studied by small-angle X-ray scattering

2006 ◽  
Vol 501 (1-2) ◽  
pp. 113-116 ◽  
Author(s):  
Bingqing Zhou ◽  
Fengzhen Liu ◽  
Jinhua Gu ◽  
Qunfang Zhang ◽  
Yuqin Zhou ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Crystalline Silicon ◽  
Nano Structure ◽  
X Ray ◽  
Silicon Thin Films ◽  
X Ray Scattering ◽  
Ray Scattering
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