Measurement accuracy analysis of photocarrier radiometric determination of electronic transport parameters of silicon wafers

2005 ◽  
Vol 97 (2) ◽  
pp. 023701 ◽  
Author(s):  
Bincheng Li ◽  
Derrick Shaughnessy ◽  
Andreas Mandelis
Keyword(s):  
Electronic Transport ◽  
Measurement Accuracy ◽  
Silicon Wafers ◽  
Accuracy Analysis ◽  
Transport Parameters ◽  
Radiometric Determination

Extra-Column Effects in Determination of Rate Parameters by the Chromatographic Method

1996 ◽  
Vol 61 (6) ◽  
pp. 844-855 ◽  
Author(s):  
Olga Šolcová ◽  
Petr Schneider
Keyword(s):  
Chromatographic Method ◽  
Dynamic Method ◽  
Axial Dispersion ◽  
Transport Parameters ◽  
Porous Particles ◽  
Loop Detector ◽  
Single Pellet ◽  
Set Up ◽  
Extra Column Effects

It was shown that the sampling loop, detector and connecting elements in the chromatographic set-up for determination of transport parameters by the dynamic method significantly influence the response peaks from columns packed with porous or nonporous particles. A method, based on the use of convolution theorem, was developed which can take these effects into account. The applicability of this method was demonstrated on the case of axial dispersion in a single-pellet-string column (SPSR) packed with nonporous particles. It is possible to handle also responses from columns packed with porous particles by a similar procedure.

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