Three-dimensional mapping of the strain anisotropy in self-assembled quantum-wires by grazing incidence x-ray diffraction

2004 ◽  
Vol 85 (16) ◽  
pp. 3581-3583 ◽  
Author(s):  
H. R. Gutiérrez ◽  
R. Magalhães-Paniago ◽  
J. R. R. Bortoleto ◽  
M. A. Cotta
Keyword(s):  
Quantum Wires ◽  
Three Dimensional ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Strain Anisotropy ◽  
X Ray ◽  
Three Dimensional Mapping ◽  
Self Assembled ◽  
Dimensional Mapping

scholarly journals Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL

2018 ◽  
Vol 25 (1) ◽  
pp. 204-213 ◽  
Author(s):  
Cristian Mocuta ◽  
Stefan Stanescu ◽  
Manon Gallard ◽  
Antoine Barbier ◽  
Arkadiusz Dawiec ◽  
...  
Keyword(s):  
Classical Method ◽  
Three Dimensional ◽  
Grazing Incidence ◽  
X Ray ◽  
Area Detector ◽  
Three Dimensional Mapping ◽  
Angle Scattering ◽  
Reflectivity Signal ◽  
Point Detector ◽  
Dimensional Mapping

This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach yields a three-dimensional mapping of the reciprocal space in the vicinity of its origin. Grazing-incidence small-angle scattering signals are recorded simultaneously. Measurements up to high momentum transfer values (close to 0.1 nm−1, also depending on the X-ray beam energy) can be performed in total time ranges as short as 10 s. The measurement time can be reduced by up to 100 times as compared with the classical method using monochromatic X-ray beams, a point detector and rocking scans (integrated reflectivity signal).

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

2008 ◽  
Vol 516 (22) ◽  
pp. 8022-8028 ◽  
Author(s):  
V. Holý ◽  
K. Mundboth ◽  
C. Mokuta ◽  
T.H. Metzger ◽  
J. Stangl ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction

2002 ◽  
Vol 65 (24) ◽  
Author(s):  
T. Roch ◽  
V. Holý ◽  
A. Hesse ◽  
J. Stangl ◽  
T. Fromherz ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

A Grazing Incidence X-Ray Diffraction Study of Self-Assembled Monolayers

1991 ◽  
Vol 237 ◽  
Author(s):  
P. Fenter ◽  
Jun Li ◽  
p. Eisenberger ◽  
T. A. Ramanarayanan ◽  
K. S. Liang
Keyword(s):  
Diffraction Study ◽  
Grazing Incidence ◽  
Dimensional Structure ◽  
Self Assembled Monolayers ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Assembled Monolayers ◽  
Self Assembled

ABSTRACTWe describe the two dimensional structure of n-Alkyl Thiols, CH3(CH217SH(C18, self-assembled on the surfaces of Au(111) and Ag(111). By using Grazing Incidence X-ray Diffraction (GIXD), we show that C18 forms ordered and dense monolayers. Although the properties of Au and Ag are very similar (for instance, the lattice constants of Au an Ag are nearly identical), the structure of C18on these two substrates is very different.

Three-dimensional mapping of nickel oxidation states using full field x-ray absorption near edge structure nanotomography

2011 ◽  
Vol 98 (17) ◽  
pp. 173109 ◽  
Author(s):  
George J. Nelson ◽  
William M. Harris ◽  
John R. Izzo ◽  
Kyle N. Grew ◽  
Wilson K. S. Chiu ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Oxidation States ◽  
Edge Structure ◽  
Full Field ◽  
X Ray ◽  
Nickel Oxidation ◽  
Three Dimensional Mapping ◽  
X Ray Absorption ◽  
Dimensional Mapping

Material analysis end-station of the Hyogo-ken beamline at SPring-8

1998 ◽  
Vol 5 (3) ◽  
pp. 509-511 ◽  
Author(s):  
T. Kaneyoshi ◽  
T. Ishihara ◽  
H. Yoshioka ◽  
M. Motoyama ◽  
S. Fukushima ◽  
...  
Keyword(s):  
Surface Analysis ◽  
Three Dimensional ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
X Rays ◽  
X Ray Diffraction ◽  
Solid State Detector ◽  
X Ray ◽  
Grazing Incidence Geometry ◽  
State Detector

Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction. X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.

scholarly journals Three-Dimensional Mapping of Soil Chemical Characteristics at Micrometric Scale by Combining 2D SEM-EDX Data and 3D X-Ray CT Images

PLoS ONE ◽  
2015 ◽  
Vol 10 (9) ◽  
pp. e0137205 ◽  
Author(s):  
Simona Hapca ◽  
Philippe C. Baveye ◽  
Clare Wilson ◽  
Richard Murray Lark ◽  
Wilfred Otten
Keyword(s):  
Three Dimensional ◽  
Ct Images ◽  
Chemical Characteristics ◽  
X Ray ◽  
Three Dimensional Mapping ◽  
Dimensional Mapping
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