Ion species control in high flux deuterium plasma beams produced by a linear plasma generator

2004 ◽  
Vol 75 (11) ◽  
pp. 4374-4378 ◽  
Author(s):  
G.-N. Luo ◽  
W. M. Shu ◽  
H. Nakamura ◽  
S. O’Hira ◽  
M. Nishi
2012 ◽  
Vol 83 (12) ◽  
pp. 123505 ◽  
Author(s):  
H. J. van der Meiden ◽  
A. R. Lof ◽  
M. A. van den Berg ◽  
S. Brons ◽  
A. J. H. Donné ◽  
...  

2017 ◽  
Vol 12 ◽  
pp. 1088-1093 ◽  
Author(s):  
K. Ješko ◽  
H.J. van der Meiden ◽  
J.P. Gunn ◽  
J.W.M. Vernimmen ◽  
G. De Temmerman

2021 ◽  
Vol 26 ◽  
pp. 100939
Author(s):  
G. Sinclair ◽  
T. Abrams ◽  
S. Bringuier ◽  
D.M. Thomas ◽  
L. Holland ◽  
...  

2021 ◽  
Vol 11 (4) ◽  
pp. 1619
Author(s):  
Jing Yan ◽  
Xia Li ◽  
Kaigui Zhu

The surface morphology of pure W bulks and nanocrystalline tungsten films was investigated after exposure to a low-energy (100 eV/D), high-flux (1.8 × 1021 D·m−2s−1) deuterium plasma. Nanocrystalline tungsten films of 6 μm thickness were deposited on tungsten bulks and exposed to deuterium plasma at various fluences ranging from 1.30 × 1025 to 5.18 × 1025 D·m−2. Changes in surface morphology from before to after irradiation were studied with scanning electron microscopy (SEM). The W bulk exposed to low-fluence plasma (1.30 × 1025 D·m−2) shows blisters. The blisters on the W bulk irradiated to higher-fluence plasma are much larger (~2 µm). The blisters on the surface of W films are smaller in size and lower in density than those of the W bulks. In addition, the modifications exhibit the appearance of cracks below the surface after deuterium plasma irradiation. It is suggested that the blisters are caused by the diffusion and aggregation of the deuterium-vacancy clusters. The deuterium retention of the W bulks and nanocrystalline tungsten films was studied using thermal desorption spectroscopy (TDS). The retention of deuterium in W bulks and W films increases with increasing deuterium plasma fluence when irradiated at 500 K.


2003 ◽  
Vol 66-68 ◽  
pp. 413-417 ◽  
Author(s):  
B. de Groot ◽  
Z. Ahmad ◽  
R.P. Dahiya ◽  
R. Engeln ◽  
W.J. Goedheer ◽  
...  

2011 ◽  
Vol 20 (4) ◽  
pp. 045016 ◽  
Author(s):  
H J N van Eck ◽  
T A R Hansen ◽  
A W Kleyn ◽  
H J van der Meiden ◽  
D C Schram ◽  
...  

2017 ◽  
Vol 125 ◽  
pp. 473-478 ◽  
Author(s):  
Wangguo Guo ◽  
Long Cheng ◽  
Jun Wang ◽  
Qingwei Fu ◽  
Shaoyang Qin ◽  
...  

2011 ◽  
Vol T145 ◽  
pp. 014041 ◽  
Author(s):  
Y Zayachuk ◽  
M H J 't Hoen ◽  
I Uytdenhouwen ◽  
G Van Oost

2011 ◽  
Vol 415 (1) ◽  
pp. S137-S140 ◽  
Author(s):  
G.J. van Rooij ◽  
J. Westerhout ◽  
S. Brezinsek ◽  
J. Rapp

2018 ◽  
Vol 46 (4) ◽  
pp. 895-899 ◽  
Author(s):  
Tianyuan Huang ◽  
Chenggang Jin ◽  
Yan Yang ◽  
Xuemei Wu ◽  
Lanjian Zhuge ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document