Investigation of single electron traps induced by InAs quantum dots embedded in GaAs layer using the low-frequency noise technique
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2004 ◽
Vol 19
(3)
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pp. 461-467
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2006 ◽
Vol 6
(6)
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pp. 1024-1029
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2011 ◽
Vol 119
(5)
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pp. 723-725
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