scholarly journals Probing ion transport at the nanoscale: Time-domain electrostatic force spectroscopy on glassy electrolytes

2004 ◽  
Vol 85 (11) ◽  
pp. 2053-2055 ◽  
Author(s):  
A. Schirmeisen ◽  
A. Taskiran ◽  
H. Fuchs ◽  
B. Roling ◽  
S. Murugavel ◽  
...  
2018 ◽  
Vol 9 ◽  
pp. 1146-1155 ◽  
Author(s):  
Yue Shen ◽  
Ying Wang ◽  
Yuan Zhou ◽  
Chunxi Hai ◽  
Jun Hu ◽  
...  

Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample. Based on the dielectric constant difference of graphene oxide (GO) sheets (reduced using various methods), EFS can be used to characterize the degree of reduction of uniformly reduced one-atom-thick GO sheets at the nanoscale. In this paper, using thermally or chemically reduced individual GO sheets on mica substrates as examples, we characterize their degree of reduction at the nanoscale using EFS. For the reduced graphene oxide (rGO) sheets with a given degree of reduction (sample n), the EFS curve is very close to a parabola within a restricted area. We found that the change in parabola opening direction (or sign the parabola opening value) indicates the onset of reduction on GO sheets. Moreover, the parabola opening value, the peak bias value (tip bias leads to the peak or valley EFM phases) and the EFM phase contrast at a certain tip bias less than the peak value can all indicate the degree of reduction of rGO samples, which is positively correlated with the dielectric constant. In addition, we gave the ranking of degree for reduction on thermally or chemically reduced GO sheets and evaluated the effects of the reducing conditions. The identification of the degree of reduction of GO sheets using EFS is important for reduction strategy optimization and mass application of GO, which is highly desired owing to its mechanical, thermal, optical and electronic applications. Furthermore, as a general and quantitative technique for evaluating the small differences in the dielectric properties of nanomaterials, the EFS technique will extend and facilitate its nanoscale electronic devices applications in the future.


1997 ◽  
Vol 94 (1-4) ◽  
pp. 49-54 ◽  
Author(s):  
M Ingram

2005 ◽  
Vol 16 (3) ◽  
pp. S125-S133 ◽  
Author(s):  
Aykutlu Dâna ◽  
Yoshihisa Yamamoto

2004 ◽  
Vol 1 (11) ◽  
pp. 2888-2891 ◽  
Author(s):  
P. Bury ◽  
P. Hockicko ◽  
S. Jurečka ◽  
M. Jamnický

2008 ◽  
Vol 92 (9) ◽  
pp. 093108 ◽  
Author(s):  
Umut Bostanci ◽  
M. Kurtuluş Abak ◽  
O. Aktaş ◽  
A. Dâna

Author(s):  
Pezhman A. Hassanpour ◽  
Patricia M. Nieva ◽  
Amir Khajepour

In this paper, the dynamics of a micro-machined structure with three parallel cantilevers is investigated. The cantilevers are electrically charged and apply electrostatic force to each other. The governing equations of motion are derived using Euler-Bernoulli beam theory and considering structural modal damping. The stability condition of the beams for various electric charges is also studied. In addition, the equations of motion are integrated to obtain the response of the beams in time-domain for a range of initial conditions. This response is used to study the behavior of the beams at the stability margin. The end application of the structure under investigation is in the device characterization. The dynamic stability condition and time-domain responses are used to investigate the reliability of the characterization. Once translated back to physical quantities, these results can be used for improving the measurements.


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