Effect of Radiation Damage on the Response of Semiconductor Detectors to Fission Fragments

H. C. Britt; G. C. Benson

doi:10.1063/1.1746812

Effect of Radiation Damage on the Response of Semiconductor Detectors to Fission Fragments

Review of Scientific Instruments ◽

10.1063/1.1746812 ◽

1964 ◽

Vol 35 (7) ◽

pp. 842-846 ◽

Cited By ~ 15

Author(s):

H. C. Britt ◽

G. C. Benson

Keyword(s):

Radiation Damage ◽

Semiconductor Detectors ◽

Fission Fragments

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Response of Semiconductor Detectors to Fission Fragments

Review of Scientific Instruments ◽

10.1063/1.1718598 ◽

1963 ◽

Vol 34 (7) ◽

pp. 822-822 ◽

Cited By ~ 7

Author(s):

Herbert Flicker

Keyword(s):

Semiconductor Detectors ◽

Fission Fragments

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Radiation damage induced by 2 MeV protons in CdTe and CdZnTe semiconductor detectors

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(03)01692-6 ◽

2004 ◽

Vol 213 ◽

pp. 315-320 ◽

Cited By ~ 22

Author(s):

M. Zanarini ◽

P. Chirco ◽

W. Dusi ◽

N. Auricchio ◽

A. Cavallini ◽

...

Keyword(s):

Radiation Damage ◽

Semiconductor Detectors ◽

Mev Protons

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Investigation of radiation damage in the SLD CCD vertex detector 2003 IEEE nuclear science symposium, medical imaging conference, and workshop of room-temperature semiconductor detectors

2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) ◽

10.1109/nssmic.2003.1351871 ◽

2003 ◽

Author(s):

J.E. Brau ◽

O.B. Igonkina ◽

C.T. Potter ◽

N.B. Sinev

Keyword(s):

Medical Imaging ◽

Radiation Damage ◽

Room Temperature ◽

Semiconductor Detectors ◽

Vertex Detector ◽

Nuclear Science ◽

Science Symposium

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Correlated Energy and Time‐of‐Flight Measurements of Fission Fragments with Semiconductor Detectors: System Design and Performance

Review of Scientific Instruments ◽

10.1063/1.1718977 ◽

1964 ◽

Vol 35 (9) ◽

pp. 1116-1123 ◽

Cited By ~ 45

Author(s):

C. W. Williams ◽

W. E. Kiker ◽

H. W. Schmitt

Keyword(s):

System Design ◽

Time Of Flight ◽

Semiconductor Detectors ◽

Fission Fragments ◽

And Performance ◽

Flight Measurements

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On the Pulse-Heigh Defects in Semiconductor Detectors for Fission Fragments

Japanese Journal of Applied Physics ◽

10.1143/jjap.4.380 ◽

1965 ◽

Vol 4 (15) ◽

pp. 380-380

Author(s):

Shoji Shirato

Keyword(s):

Semiconductor Detectors ◽

Fission Fragments

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Radiation Damage in Semiconductor Detectors

IEEE Transactions on Nuclear Science ◽

10.1109/tns.1982.4336328 ◽

1982 ◽

Vol 29 (3) ◽

pp. 1087-1100 ◽

Cited By ~ 7

Author(s):

H. W. Kraner

Keyword(s):

Radiation Damage ◽

Semiconductor Detectors

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Plasma times for fission fragments stopped in semiconductor detectors

Nuclear Instruments and Methods ◽

10.1016/0029-554x(75)90761-2 ◽

1975 ◽

Vol 129 (2) ◽

pp. 617 ◽

Cited By ~ 1

Author(s):

Eric C. Finch

Keyword(s):

Semiconductor Detectors ◽

Fission Fragments

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Radiation Damage and Its Annealing in Sodium Silica Glass

MRS Proceedings ◽

10.1557/proc-84-659 ◽

1986 ◽

Vol 84 ◽

Cited By ~ 2

Author(s):

T.D. Mark ◽

W. Ritter

Keyword(s):

Temperature Dependence ◽

Radiation Damage ◽

Absorption Spectroscopy ◽

Exponential Function ◽

Annealing Time ◽

Silica Glass ◽

Fission Fragments ◽

Radiation Sources ◽

Single Exponential Function ◽

Single Exponential

AbstractAnnealing of radiation damage in artificial sodium silica glass has been studied by absorption spectroscopy for different radiation sources (fission fragments produced by n,f reactions, alpha decays produced by n, α reactions, and 2 MeV electrons) as a function of annealing time and temperature. The annealing observed can be described best by a single exponential functionA(t) = a exp (− αt)with an Arrhenius type temperature dependence of the annealing coefficient αα(T) = α0 exp (− EA/kT)For the three different radiation sources similar activitation energies EA were deduced from the data. Possible annealing processes are discussed.

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