Mass Spectrometer Image Displacements due to Second‐Order Aberrations

1958 ◽  
Vol 29 (7) ◽  
pp. 622-624 ◽  
Author(s):  
Charles F. Robinson
Keyword(s):  
Mass Spectrometer ◽  
Second Order

Workable Magnetic Shim to Correct Second-Order Aberration in a Mass Spectrometer

1960 ◽  
Vol 31 (6) ◽  
pp. 633-636 ◽  
Author(s):  
Silvio J. Balestrini ◽  
Frederick A. White
Keyword(s):  
Mass Spectrometer ◽  
Second Order

A stigmatic, second-order, double-focusing mass spectrometer

1978 ◽  
Vol 26 (1) ◽  
pp. 77-90 ◽  
Author(s):  
Shunroku Taya ◽  
Hitoshi Tsuyama ◽  
Ichiro Kanomata ◽  
Tamotsu Noda ◽  
Hisashi Matsuda
Keyword(s):  
Mass Spectrometer ◽  
Second Order ◽  
Double Focusing

Precise atomic masses and mass differences for W and Re

1977 ◽  
Vol 55 (6) ◽  
pp. 506-511 ◽  
Author(s):  
K. S. Sharma ◽  
K. S. Kozier ◽  
J. W. Barnard ◽  
R. C. Barber ◽  
S. S. Haque ◽  
...  
Keyword(s):  
Mass Spectrometer ◽  
Atomic Mass ◽  
Second Order ◽  
Atomic Masses ◽  
Naturally Occurring ◽  
University Of Manitoba ◽  
Double Focusing ◽  
The University

The 1 m radius, second order double focusing mass spectrometer at the University of Manitoba has been used to obtain atomic mass differences for eleven mass doublets. These data are combined with well known values for the atomic masses of 13C, l6O, 35Cl, and 37Cl to derive both atomic masses and mass differences for all of the naturally-occurring isotopes of W and Re.

THE REACTIONS OF ACTIVE NITROGEN WITH ETHYLENE AND DEUTERATED ETHYLENES

1966 ◽  
Vol 44 (22) ◽  
pp. 2691-2701 ◽  
Author(s):  
Kenneth D. Foster ◽  
P. Kebarle ◽  
H. B. Dunford
Keyword(s):  
Hydrogen Atom ◽  
Mass Spectrometer ◽  
Rate Constant ◽  
Reaction Times ◽  
Order Rate Constant ◽  
Second Order ◽  
Atomic Nitrogen ◽  
Large Excess ◽  
Active Nitrogen ◽  
Initial Concentration

The reaction of active nitrogen with ethylene and deuterated ethylenes has been investigated by use of a mass spectrometer. The rate of disappearance of atomic nitrogen in the presence of ethylene appears to obey the equation[Formula: see text]where kapp is an apparent second order rate constant and [ethylene]0 is the initial concentration of added ethylene. However, exceptions to this equation are found at 0.6 Torr either for short reaction times or for small concentrations of added ethylene, and apparently for short reaction times at 2.6 Torr when a large excess of ethylene is added. Where the above equation is obeyed, kapp = (3 ± 1) × 10−13 cc molecule−1 s−1. The formation of C2D4 in the reaction of active nitrogen with C2D3H is interpreted as further evidence for the importance of hydrogen atom reactions in intermediate steps of the reaction of active nitrogen with ethylene.

The Effect of Ion Mass, Ion Energy, and Developing Time on the Sensitivity of Ilford Q Plates

1969 ◽  
Vol 23 (6) ◽  
pp. 607-609 ◽  
Author(s):  
Khairi I. Grais
Keyword(s):  
Experimental Data ◽  
Electron Impact ◽  
Mass Spectrometer ◽  
Empirical Equation ◽  
Second Order ◽  
Ion Energy

An investigation has been made of Ilford Q as to the sensitivity dependence of the ion mass, ion energy, and the developing time, using a second order mass spectrometer with an electron impact source. Description and analysis of the results obtained are represented in this paper. It was found that the experimental data agree reasonably well with the suggested empirical equation.

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